title: PROBABILITY OF ELECTRON TUNNELING THROUGH DIELECTRIC PORES IN SURFACE METAL LAYER
abstract: The paper presents a study of the influence of nanovoids formed in the metal surface layer on the field emission current (the first stage of the accelerator structure breakdown). It is shown that the field emission current through nanovoids has a resonant character. It was found that under resonant conditions, an increase in the current density from the copper surface by more than 3.5 times compared to the case of an unmodified surface is observed. The presence of a dielectric in the nanovoids e