title: Raman investigation on thin and thick CdTe films obtained by close spaced vacuum sublimation technique
abstract: Abstract The CdTe thin and thick films were obtained by the close spaced vacuum sublimation technique on a glass substrate under the following growth conditions: the evaporator temperature was 620 °C; and the substrate temperature was varied in the range from 250 °C to 550 °C. High purity CdTe powder was used as a charge for evaporation. The Raman spectra were measured using TRIAX 320 and TRIAX 550 spectrometers at room temperature. The 488‐nm line and 514.5‐nm line of an Ar + laser and a 785‐nm
journal: Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics