title: An investigation into the changes in the electronic structure of polycrystalline and single-crystal copper induced by deformation
abstract: X-ray diffraction analysis was conducted to investigate changes in the electronic structure of copper samples: polycrystalline M1-grade copper subjected to equal-channel angular pressing (ECAP) and annealing at 200 °C; single-crystal copper deformed by 10% in the (311) plane. X-ray diffraction of the polycrystalline samples revealed dominant (200) and (220) peaks in the initial M1 state. Following ECAP, reflection intensities redistributed, with the (111) peak intensity significantly increasing.
journal: Journal of Applied Physics