Datasets:
metadata
license: mit
task_categories:
- image-classification
tags:
- computer-vision
- manufacturing
- synthetic-data
- industrial-inspection
pretty_name: Nut Defect Classification (Synthetic)
size_categories:
- n<1K
Nut Defect Classification
Synthetic Industrial Quality Inspection Dataset
Nut Defect Classification (Synthetic Dataset)
This dataset is a synthetic collection of industrial nut images designed for image classification tasks, specifically focusing on defect detection in manufacturing pipelines. It serves as a benchmark and training resource for computer vision algorithms used in quality assurance.
Dataset Structure
The dataset contains a total of 261 images categorized into two classes:
defect: Images representing industrial nuts with defects (e.g., structural, surface flaws).non_defect: Images representing normal, non-defective nuts.
The dataset includes a metadata.csv mapping image paths to their respective labels, as well as a dataset-metadata.json describing the dataset details.
Directory Layout
├── README.md
├── dataset-metadata.json
├── metadata.csv
├── synthetic_defect/
│ ├── synth_defect_1.png
│ └── ...
└── synthetic_non_defect/
├── synth_non_defect_1.png
└── ...
Data Fields
The metadata.csv contains the following fields:
file_name: Path to the image file relative to the root directory (e.g.synthetic_defect/synth_defect_1.png).label: Class label (defectornon_defect).
Use Cases
- Quality Control & Automation: Training models to detect defect products on assembly lines.
- Anomaly Detection: Evaluating unsupervised or semi-supervised anomaly detection methods.
- Synthetic Data Research: Analyzing the transferability of synthetic datasets to real-world scenarios.
Licensing
Licensed under the MIT License.