text:
I’ve recently returned from a family holiday on the beach. It was idyllic – long, sunny days that never got below 25 degrees, a beautiful, deserted beach on our door step that we only shared with sea gulls and the occasional beach jogger and the crisp sea air and sound of crashing waves that lulled us to sleep each night.
Previously on these types of holidays, I would read a novel every few days. I’d sleep in until 10am and have late breakfasts before resuming my horizontal position on a beach towel or sun bed. However that’s not how it rolls when you’re holidaying with a toddler.
Wake up is, well whenever she usually wakes up, which is considered a sleepin if it’s post 7am, generally it’s earlier. Instead of lazy breakfasts, we wrangle her into our makeshift high chair (cushions at the table) and convince her to eat something… anything… then it’s time to hit the beach. However there is no horizontal lying or book reading here…
“Mummy, Sandcastle. Daddy Swim, Mummy look for shells?” The mornings would be spent splashing in the waves and making endless sandcastles for an eager toddler to jump on. Sometimes we visited the hotel pool and swam until we were wrinkly and exhausted. Still, we would hear “One more swim Daddy” and we would be convinced to jump back in the water to pretend to be a shark (again) or catch her as she jumped with reckless abandon into the pool.
It was awesome fun and so great to spend some quality time together as a family. But, my god it was tiring… at the end of the week we were saying that we needed another holiday, without the toddler.
We were holidaying during the middle of the school term, so the only people around us were other families of small children, and older travellers. I found myself staring at these grey nomads, with their magazines and wine and endless free time, and feeling a little bit jealous. Not that I want to be at that stage yet, but I couldn’t help imagine the freedom of being at the stage of life where your time is your time and you can spend it doing what you choose. The grass is always greener, right?
However turns out they were thinking the same thing about us. When we chatted to one couple, they looked doe-eyed at our daughter, who at that point was picking up rocks and didn’t want to leave until she had chosen the exact right ones.
They told us that they remembered when their little one was that age. “So cute and innocent and excited about the world,” they’d say. Now their little girl is a woman of 40 with teenage kids of her own. They wistfully watched us as we managed to convince the toddler to start walking and we made our way down to the beach for another morning of fun and adventure.
It made me realise that although it may be tiring, these are the times I’ll remember for the rest of my life. I’ll remember the look of excitement in her eyes as she jumped into the pool and grabbed my arms. I’ll remember the way she gripped my hand with trepidation as the wave rushed around our ankles. I’ll remember her sweet little kisses and welcoming smile as I greeted her bleary eyed at stupid o’clock in the morning.
Yet again in this crazy ride that is parenthood, I’m reminded to stop, smell the roses and take it all in before it’s over too soon.


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You may be eligible to earn a bonus when you transfer to a Janus Henderson IRA or purchase into a Janus Henderson account.
Rollover/Transfer to a Retirement Account
Rollover or transfer your eligible retirement accounts to a Janus Henderson Traditional Roth or SEP IRA and submit the 2021 Rollover/Transfer Bonus Contract to receive up to $2,500 towards your IRA and up to a 10% match on your 2022 IRA contributions. Download Contract.
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domain: economics


Procam Handles Sontra Hydro Parts
Breakbulk handler Procam Logistics delivered a cargo of hydroelectric components from India to Quy Nhon in Vietnam.
The consignment weighed more than 5,000 tonnes and was comprised of 18 breakbulk pieces, including four rotors, four stators, two generator transformers and four stator brackets. A team from Procam oversaw loading aboard the vessel Kamnik at Chennai Port.
“All the heavy lifting was handled safely using hydraulic trailers with heavy duty prime movers … and the over-dimensional units consisted of rotors, stators and transformers,” a spokesperson for Procam said.
Procam is a member of breakbulk association the Project Cargo Network, which connects freight forwarders worldwide.
Photo: Procam team loading Sontra components. Credit: PCN


text:
Sports (Basel). 2023 Feb 23;11(3):52. doi: 10.3390/sports11030052.
INTRODUCTION: Although research suggests that exercise benefits mental health, psychiatric disorders have been acknowledged in the ultra-endurance-athlete population. At present, the mental-health consequences of high-volume training associated with ultra-endurance sports are not well understood.
METHODS: We conducted a narrative review summarizing primary observations about mental disorders per ICD-11 criteria in ultra-endurance athletes using a keyword search in Scopus and PubMed.
RESULTS: We identified 25 papers discussing ICD-11-classified psychiatric disorders such as depression, anxiety, eating disorders, attention-deficit/hyperactivity disorder, and schizophrenia in ultra-endurance athletes.
DISCUSSION: Although evidence is limited, available papers indicate that there is a sizable incidence of mental-health issues and composite psychopathological vulnerabilities in this community. We contend that ultra-endurance athletes may represent a different, though similar, demographic than elite and/or professional athletes, as they often engage in high-volume training with similarly high motivation. This can have regulatory implications, which we also highlight.
CONCLUSION: Mental illness in ultra-endurance athletes is an underrepresented topic in sports medicine, though psychiatric disorders may be especially prevalent in this population. Further inquiry is necessary to inform athletes and healthcare practitioners about the possible mental-health implications associated with participation in ultra-endurance sports.
PMID:36976938 | DOI:10.3390/sports11030052

domain: medical


News Release from: Clackamas Co. Sheriff's Office
Posted: Wednesday, Nov. 22, 2017, 2:28 p.m.
Over the 2017 Thanksgiving holiday, the Clackamas County Sheriff's Office will increase patrols with an emphasis on reducing impaired-driver crashes.
The goal of these extra patrols: zero traffic fatalities during this year's holiday celebration.
According to the National Highway Traffic Safety Administration (NHTSA), every day 28 people lose their life to an alcohol-related traffic crash. This staggering statistic amounts to one alcohol-impaired traffic fatality every 53 minutes. This makes the chance of a person being involved in an alcohol related crash 1 in 3 through a lifetime.
The Sheriff's Office wants to help stop these completely preventable tragedies -- and reminds citizens across Oregon that everyone can play a role in preventing impaired driving.
If you or those around you drink alcohol and/or consume other impairing substances -- including marijuana -- please make responsible transportation plans. And if you witness impaired driving, don't hesitate to report it to your local authorities -- it may save a life.
Please enjoy your time with friends and family this upcoming holiday, and have a happy and safe Thanksgiving weekend!
Sergeant Brian Jensen
Office of Public Information
Clackamas County Sheriff's Office


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While the LA Dodgers have suffered a significant fall from grace, the Cleveland Indians are proving to be the MLB's best team, with much more left to come, argues Joel Sherman of the New York Post. Their 20-game winning streak has been achieved without key player Andrew Miller. He is eager to return in the next few days, which will come as a massive boost. The recent successes have also come without their arguably best player, Brantley. Good management and smart signings have given the Indians strong depth, which promises to maintain their amazing run. As things stand, they are highly likely to end up on top during the playoffs.
The current excitement surrounding the Indians’ rise and the Dodgers’ fall is overblown and won’t necessarily decide who wins the playoffs, writes Neil Paine of Five Thirty Eight. Momentum is significant, but history reveals that great or poor September results don’t end up having much influence in the playoffs. Playing well during any other part of the season was just as significant as September. The LA Dodgers may seem downbeat now, but their past stellar games suggest that they will be big hitters when push comes to shove. What has happened to both teams in the recent month, while spectacular, will not decide the playoffs.

domain: news


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|Publication number||US6279389 B1|
|Application number||US 09/698,919|
|Publication date||Aug 28, 2001|
|Filing date||Oct 27, 2000|
|Priority date||Nov 5, 1998|
|Also published as||US6196061|
|Publication number||09698919, 698919, US 6279389 B1, US 6279389B1, US-B1-6279389, US6279389 B1, US6279389B1|
|Inventors||Dennis M. Adderton, Stephen C. Minne|
|Original Assignee||Nanodevices, Inc.|
|Export Citation||BiBTeX, EndNote, RefMan|
|Patent Citations (10), Non-Patent Citations (9), Referenced by (55), Classifications (22), Legal Events (7)|
|External Links: USPTO, USPTO Assignment, Espacenet|
This application is a division of U.S. Ser. No. 09/186,742 filed on Nov. 5, 1998, now U.S. Pat. No. 6,196,061.
1. Field of the Invention
The present invention relates to scanning probe microscopes (SPMs) and, more particularly, to improved SPMs capable of referencing height measurements to the sample surface in a variety of applications.
2. Description of the Related Art
An SPM is capable of high-resolution non-destructive measurements in a variety of semiconductor applications. The atomic force microscope (AFM) is the SPM most extensively used today for imaging and characterizing step height and surface roughness on samples such as silicon wafers and thin film magnetic heads. It has been referred to as an essential characterization tool (see, for example, Strausser, Schroth, and Sweeny, “Characterization of the LPCVD Grown Rugged Polysilicon Surface Using Atomic Force Microscopy,” Future Fab International, Issue 4, Vol. 1, 307-311 (1997)). The typical AFM includes a probe which includes a flexible cantilever and a tip mounted on the free end of the cantilever. The probe is mounted on a measurement head that is mounted on a common mechanical reference structure with the sample. The mechanical head typically includes an XY actuator assembly and a Z actuator. The XY actuator assembly drives the probe to move in an X-Y plane for scanning. The Z actuator, which is mounted on the XY actuator assembly and which supports the probe, drives the probe to move in a Z axis extending orthogonally to the X-Y plane.
AFMs can be operated in different modes including contact mode and TappingMode. In contact mode, the cantilever is not oscillated, and cantilever deflection is monitored as the tip is dragged over the sample surface. In TappingMode (Tapping and TappingMode are trademarks of Veeco Instruments, Inc.), the cantilever is oscillated mechanically at or near its resonant frequency so that the tip repeatedly taps the sample surface or otherwise interacts with it, dissipating energy and reducing the cantilever's oscillation amplitude. The oscillation amplitude indicates proximity to the surface and may be used as a signal for feedback to reduce the forces between the probe-tip and the sample surface, and thus prevent damage or contamination that may be caused by a contact-mode measurement. In fact, in many cases it may be necessary for the reference measurement to be a non-contact measurement. In any operational mode, interaction between the probe and the sample surface induces a discernable effect on a probe operational parameter, such as cantilever deflection, that is detectable by a sensor.
Next, note that wafer scale SPM's have lateral and vertical resolutions of roughly 2 nm and 0.1 nm, respectively. The 0.1 nm vertical resolution is typically limited to vibrational and thermal noise between the associated probe tip and the sample. Nevertheless, the SPM can obtain detailed topographic information in ambient air. Surface images of this kind are not available with the scanning electron microscope (SEM) because of its relatively large depth of focus. Surface details at this level can be resolved in the transmission electron microscope (TEM), but the procedure requires sectioned samples, and is tedious, time consuming, and destructive.
For both step height and surface roughness measurements, the SPM's utility is in its metrological capabilities and not its imaging capability—meaning that the numerical values produced are more important than visualization of the surface. Importantly, features on samples measured by a SPM often need to be resolved beyond the 0.1 nm limitation. Many different types of SPM sensors, with sensitivities beyond 0.1 nm, have been proposed. These include: 1) the common optical-lever sensor (see, e.g., Meyer and Amer, “Novel Optical Approach to Atomic Force Microscopy,” Appl. Phys. Lett. 53, 1045 (1988); Alexander, Hellemans, Marti, Schneir, Elings, Hansma, Longmire, and Gurley, “An Atomic-Resolution Atomic-Force Microscope Implemented Using an Optical Lever,” Appl. Phys. Lett. 65 164 (1989); 2) the piezoresistive sensor (Tortonese, Barrett, and Quate, “Atomic Resolution With an Atomic Force Microscope Using Piezoresistive Detection,” Appl. Phys. Lett., 62, 8, 834-6 (1993)); 3) and the interdigital sensor (Manalis, Minne, Atalar, and Quate, “Interdigital Cantilevers for Atomic Force Microscopy,” Appl. Phys. Lett., 69 (25) 3944-6 (1996); Yoralioglu, Atalar, Manalis, and Quate, “Analysis and design of an interdigital cantilever as a displacement sensor,” 83(12) 7405 (June 1998)). Unfortunately, these sensors have shown ultra-low sensitivities only when either not in contact with the sample, or when using a highly specialized and expensive apparatus, which is not suitable for a manufacturing environment.
Practical limitations restrict the typical SPM when operating over large areas at high speeds. The area restriction is primarily due to the lack of low-noise, large displacement scanners. Scanners that can traverse larger areas have greater vibration noise. In light of the fact that the SPM's use is already limited due to drawbacks associated with vibrations in the operating environment, any increase in noise due to scanner operation significantly exacerbates the SPM's performance problems.
Many applications in the microelectronics industry need the resolution of the SPM over large areas. As features on microelectronics and data storage devices continue to shrink, this need will only increase further. In fact, features of interest are quickly falling below the optical diffraction limit and the optical scatter detection limit of the instrument. This means tools that rely on light may no longer be able to service the industry in high throughput large area defect analysis.
In addition, AFMs have historically had problems with thermal drift and acoustic vibrations in the mechanical path between the probe and the sample. Changes in the mechanical reference path appear as noise in the AFM topography image. In current AFM designs, this noise is reduced by making the mechanical reference path rigid and of thermally stable materials that are relatively expensive and that do not eliminate thermal drift and acoustic vibrations. A more cost effective and reliable solution is desired.
One solution in such a case is to make a differential AFM measurement optically. However, such a solution is inadequate for applications contemplated by the present invention. In particular, optical displacement measurements are problematic on unknown sample surfaces because, for example, topographic features can cause scattering of the reflected light which can yield erroneous data.
The art is in need of an improved SPM that can operate over large areas at high speeds for both metrology and defect analysis while minimizing the effects of noise in the mechanical reference path. The solution should be applicable to the standard SPM to increase sensitivity for defect review and surface visualization. Furthermore, the scanner vibration restrictions for both systems should be significantly reduced and, in certain applications, eliminated.
The present invention relates to improving an SPM, e.g., an AFM, by incorporating structures capable of referencing the associated height measurement to a surface of the sample under study to increase the sensitivity of the AFM beyond mechanical noise limits. The present invention quickly measures large sample areas both directly and differentially, and offers significant advantages for both metrology and defect identification applications.
The AFM is preferably constructed such that there is a mechanical structure which joins the sample mounting platform to the measurement probe. This structure forms a mechanical path for the measurement probe to be referenced with respect to the sample under inspection. Preferably, a reference probe is used to reference the surface topography measurement to a portion of the sample surface that is in close proximity to the measurement probe. The reference probe, as well as the measurement probe, detects any thermal or acoustic noise occurring in the mechanical reference path. The unwanted noise can be subtracted from the measured topography, or the desired noise free signal can be acquired from a differential measurement probe.
At least one preferred embodiment includes a novel probe design capable of providing more than one measurement point on the sample surface, thus allowing the probe to return differential position information which does not contain noise associated with variations in the mechanical reference path. Further, in some cases where more than one probe is used to measure the sample topography, it is possible to extract absolute height data from the differential signal.
Alternatively, and advantageously with respect to the present application, it is possible to collect surface roughness statistics or to detect defects in a known sample surface. In the semiconductor industry, it is often necessary to locate low-density defects on the surface of a very flat blank wafer or photomask. An array of probes providing differential data can be used to detect surface defects in parallel, over a large area. Because it is very unlikely that two adjacent probes will encounter a defect simultaneously, defects can be efficiently located by monitoring the differential signal between the adjacent probes. In this case, absolute topographical data is not collected; rather, the location of defects may be tabulated for a report to the user so that large amounts of topographic data do not need to be stored and analyzed.
According to a further aspect of the invention, adjacent probes in a one-dimensional array may be referenced with respect to one another by way of interdigitated fingers forming a diffraction grating. A diffraction grating of this type is disclosed in Manalis, et al., supra, the disclosure of which is expressly incorporated herein by reference. A laser is included for directing light energy toward the grating. Light reflected off the grating produces an interference pattern representing the differential deflection of two adjacent probes. Differential probes can also be used to detect defects in repeating patterns, such as photomasks or integrated circuit dies, where two probes measuring respective areas on adjacent patterns, or on one known good pattern and one pattern under test, can be referenced to one another. The locations of defects can then be tabulated and reported to the user so that large amounts of topographic data do not need to be stored and analyzed.
The reference probe can either be separate or integrated with the AFM measurement probe. For example, a typical optical lever includes two AFM cantilever probes having parallel, independent force detection devices that provide differential data that is free from acoustic and thermal noise. Various other devices can be used to detect the deflection of two independent beams. For instance, interdigitated fingers as described above may be used; a piezoresistor integrated into the cantilever may provide a deflection signal; two piezoresistive cantilevers can be arranged with unique bridge circuits such that the deflection signals can be differenced; or two piezoresistive elements can be arranged in opposing positions in the same bridge circuit to give a differential output signal.
In the case of the optical lever, the detection device is greatly simplified if the two AFM probes, being adjacent to one another, are connected at their respective free ends by a flat, reflective cross-member. A laser incident on the cross-member experiences a change in reflected angle along the axis of the cantilevers that is dependent on the deflection of the two-probe assembly. Deflection of one probe with respect to the other changes the angle of the reflected laser beam in the axis of the cross-member. Orthogonal detection of the reflected laser angle provides independent differential and average-deflection signals. Although absolute height data from either of the probes is not readily extracted independent of the other probe, it is not required.
Another embodiment of a differential integrated AFM probe uses interdigital cantilever force detection. The deflection of the interdigital measurement lever is measured with respect to a reference lever by analyzing the interference pattern caused by the displacement of the interdigitated fingers. In this embodiment of the invention, an additional probe-tip is located on the reference beam and, preferably, is brought into contact with the sample surface. The interference signal represents the differential displacement of the two probe-tips. The reference probe-tip can also be made blunt or flat in this embodiment so as to average the topography over which the reference probe is scanned.
According to a further aspect of this embodiment, the measurement probe can be operated in an AC mode, such as non-contact, or TappingMode (see, e.g., U.S. Pat. No. 5,412,980 to Elings et al. for a discussion of such operation. The disclosure of U.S. Pat. No. 5,412,980 patent is expressly incorporated herein by reference). The differential displacement signal will contain both a DC-to-low frequency component and an AC component at the frequency of the probe oscillation. The amplitude of the AC displacement signal is used by an AFM feedback loop to maintain the probe in close proximity to the sample surface. The differential DC-to-low-frequency displacement signal is used to generate a topographic image of the sample free of the acoustic and thermal noise that occurs in the unreferenced image.
According to a still further aspect of the invention, problems associated with optical displacement measurements made in TappingMode are eliminated by measuring the reference distance capacitively, i.e., without bringing the reference probe into contact with the sample surface. A capacitance reference probe is attached to the AFM measurement head such that it experiences the same noise transmitted through the measurement head as the measurement probe. By subtracting the displacement measured by the reference probe from the measured topography data, problems associated with optical measurements are avoided.
Notably, in order to obtain the sample topography in any embodiment, one of the probe-tips can be made dull or flat so as to average the high-resolution topography data as the tip is scanned over the sample. The sharp probe tip will then dominate the differential signal as it follows the surface topography.
These and other objects, features, and advantages of the invention will become apparent to those skilled in the art from the following detailed description and the accompanying drawings. It should be understood, however, that the detailed description and specific examples, while indicating preferred embodiments of the present invention, are given by way of illustration and not of limitation. Many changes and modifications may be made within the scope of the present invention without departing from the spirit thereof, and the invention includes all such modifications.
FIG. 1 is a side elevational view of an AFM according to the present invention, illustrating the use of the sample surface to reference the position of the AFM probe;
FIG. 2 is a schematic diagram illustrating an AFM according to a preferred embodiment of the present invention;
FIG. 3 is a perspective view of a differential probe according to the present invention, showing an embodiment that can be used with a common optical lever AFM for differential measurements;
FIG. 4 is a partially broken-away bottom plan view of an interdigitated AFM probe according to the present invention in which the reference beam is indexed to the sample surface;
FIG. 5 is a partially broken-away top plan view of an array of interdigitated probes according to the present invention, wherein the probes are referenced to fixed reference beams as well as to adjacent probes;
FIG. 6 is a partially broken away perspective view of a mounting stage for the multi-probe embodiments of the present invention, the stage allowing adjustment of the relative angle between the sample and the probe assembly;
FIG. 7 is a side elevational view of a piezoresistive cantilever with which the invention is usable;
FIG. 8 is a schematic diagram of a force detection device according to the present invention including a pair of the piezoresistive cantilevers shown in FIG. 7; and
FIG. 9 is a schematic diagram of an alternative embodiment of the force detection device shown in FIG. 8.
The present invention and the various features and advantageous details thereof are explained more fully with reference to the non-limiting embodiments described in detail in the following description.
Referring to FIG. 1, an atomic force microscope (AFM) 10 which references the AFM topography measurement to the surface of the sample under inspection is illustrated. In particular, AFM 10 includes a sample 12 that is mounted on a sample mounting and positioning platform 14. Sample 12 is preferably held in place magnetically, by a vacuum chuck, or by an adhesive substance (not shown). Platform 14 may include a device or devices to translate, scan, or otherwise position sample 12 in two or three dimensions, and may also include a rotational positioning mechanism for controlling the relative plane of a sample surface 16 with respect to sample mounting platform 14. Note that this is the orientation shown in FIG. 1 and in no way should restrict the possible orientations of AFM 10. Inverting or otherwise orientating the AFM 10 will not change its performance.
Next, an AFM measurement head 18 is positioned above the sample 12. AFM measurement head 18 is held in position with respect to sample 10 by a mechanical reference structure 20. Structure 20 must hold measurement head 18 in proximity to sample 12 with high stability. As is known in the art, structure 20 preferably has high mechanical stiffness and low thermal expansion. Structure 20 may also include an adjustable positioning mechanism (not shown in FIG. 1) to bring measurement head 18 into proximity with sample surface 16.
Measurement head 18 incorporates a probe assembly 21 including an AFM measurement probe 22. Measurement head 18 also preferably includes a three axis positioning mechanism (not shown) on which is mounted AFM measurement probe 22. Head 18 may also include a rotational positioning mechanism (not shown) for controlling the relative plane of the positioning axis with respect to the plane of the sample surface 16. A force detection device (e.g., a piezoresistor, interdigitated fingers, an optical beam bounce lever, etc. the details of which are not shown) measures the force of measurement probe 22 on sample surface 16.
Preferably, probe assembly 21 is configured to scan a surface of the sample to provide two points of measurement and thus detect a change in the topography of the sample. For instance, probe assembly 21 may additionally include a reference probe 24 that measures the displacement of measurement head 18 with respect to sample surface 16, e.g., as caused by mechanical system “noise”. Alternatively, as opposed to an independent reference measurement probe, a reference measurement device can be incorporated into, or mounted in conjunction with, AFM measurement probe 22. Also shown in FIG. 1 is a cantilever beam 26 attached, preferably to a substrate (e.g., 40 in FIG. 3) of AFM probe 22 at one end while the opposite end includes a probe tip 28 for scanning sample surface 16, as described in further detail below.
In operation, AFM 10 scans back and forth over surface 16 of sample 12 as the probe assembly 21 detects changes in the topography of surface 16. By using probe assembly 21 (the preferred embodiments of which will be described hereinafter below with reference to the drawings), a signal indicative of a relative topography between probes 22, 24 can be obtained, preferably with a single measurement.
A significant aspect of at least some of the following embodiments of probe assembly 21 is that only one of any particular pair of measurement/reference probes measures a change in topography at any instant in the scanning operation, while the other of that pair functions as a reference measurement device such that differentiating its output from the output of the measurement probe accounts for the mechanical noise of the AFM. Using the techniques discussed below, a single differential displacement signal can be obtained which effectively nullifies the mechanical noise associated with the AFM from the output of probe assembly 21.
Turning to FIG. 2, if the AFM 10 is operated in a non-contact mode or in TappingMode, the probe assembly 21 can be oscillated by a tip oscillator 146 of the measurement head 18 to drive the probe assembly 21 appropriately, usually at or near the resonant frequency of at least one of the probes of probe assembly 21. An electronic signal is applied, under control of an AFM control/computer 152, from an AC signal source (not shown) to oscillator 146 to drive the probes 22 and 24 (the probe 24 being omitted from FIG. 2 for ease of illustration) of probe assembly 21 to oscillate at a free oscillation amplitude AO (assuming that the AFM is operating in TappingMode).
Probe assembly 21 can also be driven towards and away from the sample 12 using a suitable XYZ actuator assembly 154 of the measurement head 18 which is also controlled by the computer 152. It should be noted that rather than being configured for driving the probe assembly 21 towards the sample 12, as illustrated, the AFM could be configured for mounting the sample 12 on a movable X-Y stage 156 so that the X-Y stage can be used to translate the sample 12 relative to the probe assembly 21 and the actuator assembly 154 is free to simply perform scanning motions. Probe assembly movement is monitored by a suitable displacement sensor 158 that may, for example, employ a laser and photodetector as well as other components. As is known in the art, the signals from the sensor 158 can be used to determine probe oscillation amplitude, frequency, and phase, as well as other parameters, and so measure the probe-sample interaction. The computer 152 can use this measurement as a feedback signal to control the vertical probe-sample position via the actuator assembly 154 so as to keep the probe assembly-sample interaction constant as the actuator scans the probe laterally over the sample surface in an X-Y plane.
In this feedback mode, the voltage or signal applied to the Z (vertical) portion of the actuator assembly 154 is representative of a surface characteristic of interest, such as surface topography. Recording this signal as a function of scan position yields a data scan representative of the surface characteristic of interest. Finally, a suitable image display device 160 may be connected to the computer 152 to display a humanly discernable image (such as a video image) of an output signal. Various probe configurations now will be detailed.
FIG. 3 shows a two-probe cantilever 30 which is usable as the probe assembly 21 of FIGS. 1 and 2 and which provides differential AFM measurements with optical lever force detection. First and second cantilever beams 32 and 34 are each fixed at one end 36, 38, respectively, to a cantilever substrate 40 and are free to deflect at a corresponding opposite end 42, 44, respectively. Probe tips 46 and 48 are affixed to cantilever beams 32, 34, respectively, and are arranged such that they can be brought into contact, or close proximity to the sample surface 16 (in FIG. 1). Either one or both of the probe tips 46, 48 may be dull or flat such that the topography of the area scanned with the probe tip 46 or 48 may be effectively averaged or similarly measured for use as a reference. A cross beam 50 connects the two cantilever beams 32, 34 at their free ends 42, 44. Cross beam 50 is sufficiently flat and reflective for a laser or light source incident on the member to be reflected.
A laser or light source 52 (preferably mounted on an AFM head, e.g., 18 in FIG. 1) emits light energy toward member 50 such that light incident on cross beam 50 reflects at an angle θ which is sensitive to the deflection of either one, or both, of probe tips 46, 48. A four quadrant photodetector 54 (also preferably mounted on the AFM head) collects the reflected light beam. The angle θ of the beam, is analyzed in two orthogonal axes in order to determine both the average deflection and the differential deflection of probe tips 46, 48 for eliminating the effect of noise on the measurement of reflected light. This embodiment can be used with the tilt controlled probe mounting stage which is described below with reference to FIG. 6.
Turning to FIG. 4, a bottom plan view of an interdigitated AFM probe 60 is illustrated that is usable as the probe assembly 21 of FIGS. 1 and 2. Probe 60 has a cantilever structure 61 that permits a reference beam to be indexed to a sample surface (for example, 16 in FIG. 1). A measurement cantilever beam 62 is fixed at one end 64 to a cantilever substrate 66 while an opposite end 68 of beam 62 is free to deflect. A sharp measurement probe-tip 70 is located at end 68 of measurement beam 62. Although they can be located on one or both sides of measurement beam 68, a pair of reference cantilever beams 72, and 74 are preferably located on either side of the measurement beam 62 (as shown in FIG. 4). One or more reference probe tips 76 (two in FIG. 4) are affixed to reference beams 72, 74 such that they may be brought into close proximity or contact with the sample surface. The relative location of reference probe-tip 76 to measurement probe-tip 70 can be changed depending on the requirements of a particular sample. For example, they may be placed in line with a lengthwise axis of the cantilever structure 61, or the measurement and reference probe tips 70, 76, respectively, may be interchanged in position.
Still referring to FIG. 4, a pair of diffraction gratings 78 and 79 each includes interdigitated fingers 80 which, in the preferred embodiment, are alternately attached to measurement beam 62 and reference beams 72, 74 such that fingers 80 extend generally perpendicularly to cantilever axis “X.” More specifically, first interdigitated fingers 82 are attached to reference beam(s) 72, 74, and a plurality of second interdigitated fingers 84 are alternately attached to measurement beam 62 such that each finger 84 is adjacent to at least one finger 82, i.e., every other finger 80 in grating 78 is a first finger 82 or a second finger 84. A stress inducing surface structure 86 is located on either measurement beam 62 or on at least one of reference beams 72, 74 in order to cause a deflection biasing in the diffraction gratings 78 and 79. Structure 86 may be a piezoelectric film such that an applied voltage can control the amount of stress. By appropriately selecting the properties of structure 86 for applying an optimum biasing force, significant advantages in the accuracy of the resultant interference pattern can be achieved. This embodiment can be used to achieve a differential topography measurement either in contact mode operation or in a non-contact operation, such as TappingMode.
In order to operate the invention in a non-contact mode, at least one of the reference beams 72 and 74 is typically brought into contact with the sample surface (16 in FIG. 1), reference beams 72, 74 being disposed lower than measurement beam 62 when viewed in cross-section. Measurement beam 62 is then oscillated in close proximity to the sample surface. The amplitude and phase of oscillation of measurement beam 62 is detected by reflecting a coherent light source (for example, 52 in FIG. 3) off diffraction grating 78 or 79, collecting the reflection on a photodiode (for example, 54 in FIG. 3), and demodulating the resulting signal at the oscillation frequency.
The photodiode signal also provides an indication of the differential DC or low-frequency deflection of probes 70, 76. An AFM feedback loop uses the modulated signal amplitude or phase to servo the measurement probe 70 to a constant amplitude or force on the sample surface. The differential position of measurement probe 70 can then be determined from the DC or low frequency photodiode signal.
FIG. 5 shows another preferred embodiment of the probe assembly usable as the probe assembly 21 of FIGS. 1 and 2 wherein an AFM probe 90 has a parallel probe array 92 with three differential measurement cantilever beams 94, 96, 98 and two reference cantilever beams 100, 102. This embodiment is not limited to the exact cantilever arrangement shown in FIG. 5. Instead, the measurement and reference cantilevers 94, 96, 98 and 100, 102, respectively, can be interspersed in any pattern that is appropriate to the desired sample measurement. The configuration shown is convenient for explaining the functionality of one such system. In this embodiment, reference cantilevers 100 and 102 do not make contact with the sample surface (16 in FIG. 1). Measurement cantilevers 94, 96, and 98 each have a probe tip 104, 106, and 108, respectively, affixed to an end of the associated cantilever such that probe tips 104, 106, 108 can be brought into close proximity or contact with the sample surface. Any of probe tips 104, 106, 108 may be blunt or flat in order to effectively average the topography over which they are scanned.
A diffraction grating 110 is formed between cantilevers 100 and 94 by interdigitated fingers 112, 114 which are alternately attached to measurement beam 94 and the reference beam 100, respectively, as described above. Note that, unlike the embodiment shown in FIG. 4, the deflection of probe 94 as measured by grating 110 is preferably referenced to a cantilever substrate 116 to which cantilever beams 94, 96, 98, 100, and 102 are attached, and not to the sample surface. Similarly, the deflection of probe 98 when measured by grating 122, will be referenced to cantilever substrate 116 to which the cantilevers are attached, and not to the sample surface. A positioning stage (131 in FIG. 6, described in further detail below) can be used to maintain a constant average force of measurement probes 94, 98 on the sample surface by appropriately positioning the height and the angle of probe array 92 with respect to the sample surface in response to the deflection of probes 94 and 98, when measured with gratings 110 and 122.
Further, the differential deflection of probes 94 and 96 with respect to one another can be measured with a grating 118. In addition, the differential deflection of probes 96 and 98 with respect to one another can be measured with grating 120. Overall, the measured differential deflection signals can be processed for detecting defects on a generally flat sample surface with high sensitivity, the detection signals being free of the acoustic and thermal noise associated with previous designs.
Next, in FIG. 6, an AFM 130 having a positioning stage 131 for the multiprobe embodiments is shown. Positioning stage 131 allows adjustment of the relative height and angle between a sample 132 and a multiprobe array 136. In operation, the multiprobe array 136 is brought into close proximity or contact with the sample 132. Notably, the relative angle of probe array 136 with respect to a surface 138 of sample 132 is highly critical to achieving approximately equal deflection of all measurement probes of array 136 when the probes of array 136 contact sample surface 138. The error in the angular alignment between probe array 136 and sample 132 is determined by determining the difference between the deflection of the two probes (not shown in FIG. 6) at the extreme ends of array 136, or by weighing the sum of at least some of the probe deflections across the length of array 136, or by measuring the deflection of any number of probes in the array and comparing their corresponding deflections. A controller (not shown) of AFM 130 can then use the error in the angular alignment to adjust a pair of position actuators 140 and 142 which are mounted to an AFM measurement head 144 of the AFM 130, until the probe array 136 is aligned with sample surface 138. This serves to maintain low force imaging across the probe array 136 as well as to maximize the deflection range available in each probe of array 136.
Alternatively, it is known in the art that the cantilever of the SPM can be constructed to include an integrated actuator (see, e.g., Minne, et al., Applied Physics Letters, Vol. 72, p. 2340 (1998), the disclosure of which is expressly incorporated herein by reference). The integrated actuator can replace the role of the positioning stage or bulk actuator by translating the tip across the sample to be imaged, but, more importantly, it can move the probe tip vertically to adjust the force, or distance, between the probe tip and the sample. The integrated actuator has two main advantages over a bulk actuator when operating an SPM. First, the integrated actuator generally has a much higher bandwidth than bulk actuators. This increased bandwidth increases the speed at which the top can be scanned across the sample, lowering the SPM image acquisition time. And second, for parallel arrays, since each probe tip experiences a different and independent interaction with the sample, an integrated actuator allows feedback operation across the entire array. This is not possible for a probe array when scanning with a single combined vertical actuator.
There are many ways to implement an actuator onto an SPM cantilever. These include, but are not limited to, piezoelectric, electrostatic, and thermal actuators. Any of these types of actuators could be included on the cantilevers described within this application.
Turning to FIGS. 7-9, an alternative force detection device 161 that may be implemented into the present invention in place of a photodetector includes a piezoresistor integrated into the cantilever. Two piezoresistive cantilevers can be arranged with unique bridge circuits such that the deflection signals can be subsequently differenced. Alternatively, the two piezoresistive elements can be arranged in opposing positions in the same bridge circuit to give a differential output signal.
With particular reference to FIG. 7, a schematic diagram of a typical piezoresistive cantilever 161 is shown. Cantilever 161 is made of (100) silicon with an integrated silicon tip 162 for probing the sample surface. Cantilever 161 extends outwardly from a rigid die/substrate 164 that is used for handling and mounting the cantilever into the microscope. An electrical path 166 is integrated into silicon cantilever beam 168 and is accessible via a pair of made-through electrical contact leads 170. When operating piezoresistive cantilever 161, a force from the sample is applied to tip 162, causing cantilever beam 168 to bend. The bending of beam 168 causes a stress to form in the beam. Notably, silicon is a piezoresistive material and therefore, a change in its stress will cause a change in its resistance. This change in resistance is converted to a change in voltage, via electrical leads 170, in a Wheatstone bridge.
FIGS. 8 and 9 show two separate ways of connecting two piezoresistive cantilevers to a Wheatstone bridge to cancel the effects of mechanical noise. In FIG. 8, two cantilevers 172 and 174 are connected to two separate bridge circuits 176 and 178 powered by a source 180. The outputs of each bridge circuit 176, 178 are then subtracted in amplifier 182 such that the output of amplifier 182 is the desired differential signal. In FIG. 9, the differential output of a pair of cantilevers 184, 186 is taken in a single bridge circuit 188 (powered by a source 190 and having a single amplifier 192) by placing cantilevers 184, 186 in opposite positions on bridge circuit 188. As a result, the output of amplifier 192 provides the desired differential signal without requiring any additional steps similar to the most preferred of the previously discussed embodiments of probe assembly 21 of FIGS. 1 and 2.
Alternatively, and referring again to FIG. 1, the reference probe 24 may take the form of a capacitance-measuring probe that can be brought into close proximity to the sample surface near the measurement probe 22, in which case no light source is required. In this case, the reference probe 24 is attached to the AFM measurement head 18 such that it is subject to the same acoustic and thermal noise as the measurement probe 22. The displacement measured by the capacitance reference probe can then be subtracted from the AFM topography data, either in analog electronics or in the AFM data-collection computer (152 in FIG. 2). High sensitivity is achieved with the capacitance reference-probe by dithering it normal to the plane of the sample surface, and demodulating the capacitance signal at the dithering frequency.
In yet another alternative, the capacitance displacement probe described above may be replaced with a non-contact cantilever probe which measures the proximity to the sample surface by means of electrostatic force. The mechanical deflection of a cantilever due to an electrostatic force is known in the art to behave like a capacitive system (see, e.g., Leng and Williams, SPIE Vol. 1855, Scanning Probe Microscopes II (1993/35), the disclosure of which is expressly incorporated herein by reference. In this embodiment, a potential applied between the cantilever probe and the sample surface results in an attractive force proportional to the capacitance between them. This force can be measured by the DC deflection of the cantilever probes, or modulation can be used to increase the sensitivity of the measurement. The cantilever can be modulated mechanically or electrostatically at its resonance. Monitoring the change in the amplitude or resonant frequency of cantilever oscillation gives a measure of the change in distance between the cantilever probe and the sample surface. Further, driving the cantilever electrostatically at half of its resonant frequency and monitoring the amplitude of the response results in a measure of the capacitance between the reference probe and the sample independent of any existing DC potential.
Also note that the preferred embodiments described herein can be used to not only identify instances of changes in surface topography, but can be used to identify the X-Y location of such changes using the three-axis positioning mechanism, in conjunction with the system computer, to “tag” the location at which a change is detected.
Although the best mode contemplated by the inventors of carrying out the present invention is disclosed above, practice of the present invention is not limited thereto. It will be manifest that various additions, modifications, and rearrangements of the features of the present invention may be made without deviating from the spirit and scope of the underlying inventive concept.
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|U.S. Classification||73/105, 977/874, 977/849, 977/860, 977/955|
|International Classification||G01B7/34, G01B5/28, G01Q70/06, G01Q70/04, G01Q60/38|
|Cooperative Classification||B82Y35/00, Y10S977/852, Y10S977/849, Y10S977/86, Y10S977/874, Y10S977/868, Y10S977/955, G01Q70/04, G01Q60/38|
|European Classification||B82Y35/00, G01Q70/04, G01Q60/38|
|Jul 14, 2003||AS||Assignment|
Owner name: VEECO INSTRUMENTS, INC., NEW YORK
Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:NANODEVICES INCORPORATED;REEL/FRAME:014250/0694
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Year of fee payment: 4
|Mar 9, 2009||REMI||Maintenance fee reminder mailed|
|Aug 28, 2009||LAPS||Lapse for failure to pay maintenance fees|
|Oct 20, 2009||FP||Expired due to failure to pay maintenance fee|
Effective date: 20090828
|Sep 28, 2010||AS||Assignment|
Owner name: VEECO METROLOGY INC., CALIFORNIA
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Free format text: CHANGE OF NAME;ASSIGNOR:VEECO METROLOGY INC.;REEL/FRAME:027111/0461
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text:
birthday present ideas for best he-friend
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domain: artistic


text:
Car: Ford Mustang Convertible
What makes it special: The first-generation Ford Mustang was manufactured from March 1964 until 1973. The introduction of the Mustang created a new class of automobile known as the “Pony Car.” The Mustang’s styling, with its long hood and short deck, proved wildly popular and inspired a host of competition. It was initially introduced as a hardtop and convertible with the fastback version put on sale in August 1964. At the time of its introduction, the Mustang, sharing its underpinnings with the Falcon, was slotted into a compact car segment, then with each revision, Mustang saw an increase in overall dimensions and in engine power.
What made it famous: The 1966 Mustang debuted with moderate trim changes including a new grille, side ornamentation, wheel covers and gas cap. Ford’s new C-4 “cruise-o-matic” 3-speed automatic transmission became available for the 225 hp V8. The 289 “HiPo” K-code engine was also offered with a C-4 transmission, but it had stronger internals. The long duration solid-lifter camshaft that allowed the high revving 289 to make the horsepower it was known for. A large number of new paint and interior color options, an AM/eight-track sound system, and one of the first AM/FM mono automobile radios were also offered. It also removed the Falcon instrument cluster; the previously optional features, including the round gauges and padded sun visors, became standard equipment.
Why I would want one: Had one, but in the Coupe model. Great looking, quick with a V8. Another car that will return to my possession one day.
Fun fact: The Ford Mustang would be the best-selling convertible in 1966, with 72,119 sold, beating the number two Chevrolet Impala by almost 2:1.

domain: history


text:
Designed in conjunction with Lisa Kiss, programmed by myself utilizing WordPress.
This was a mockup I did for a friend who was a travel writer, who also had a love of old maps. The concept came out of some explorations I was doing while trying to learn the Google Maps API. The front page is a live Google Map, stripped-down and restyled. New elements were added […]


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I'm 72-years old and like to be active. I've had rheumatoid arthritis for 35 years. After a total hip and a total knee joint replacement, I find it much more difficult to take long walks. What can I do to regain this ability?
You may want to consider an exercise program in the pool. This is an excellent way to build up strength and endurance without the effects of gravity. The warm water also relaxes the muscles and reduces joint pain and stiffness.
You can transfer those skills on land by slowly increasing the distance walked. Many people use some support such as a cane during long walks. This enables them to increase their distance safely.
B. Willem Schreurs, MD, PhD, et al. Acetabular Revision with Impacted Morselized Cancellous Bone Graft and a Cemented Cup in Patients with Rheumatoid Arthritis. In The Journal of Bone and Joint Surgery. April 2003. Vol. 85-A. No. 4. Pp. 647-652.
*Disclaimer:* The information contained herein is compiled from a variety of sources. It may not be complete or timely. It does not cover all diseases, physical conditions, ailments or treatments. The information should NOT be used in place of visit with your healthcare provider, nor should you disregard the advice of your health care provider because of any information you read in this topic.


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Nothing makes an old house feel old and decrepit like cracked and bumpy walls.
But transforming walls from drab and dreary to bright and cheerful isn’t difficult. It’s messy, but not complicated.
When I began the renovation on my 85-year-old Tudor revival-style house, updating and repairing the walls was first on our list. Like most old homes built before World War II, my walls are made of plaster, not the drywall found in most post-WWII homes. Preservationists insist that plaster is a better product than modern drywall. After all, plaster has stood the test of time.

domain: design


Water fluoridation has been a part of every American’s daily life for more than seven decades. Grand Rapids, Michigan became the first US city to adjust the fluoride content of its drinking water supply and implement community water fluoridation in 1945.
Healthier Colorado – Fluoride Project notes that the discovery of fluoride in Colorado Springs’ mountain water prompted studies on its oral health benefits. By 1962, the US Public Health Services (USPHS) made a formal recommendation for the fluoridation of public water supplies to fight cavities. This is not to say, however, that groups opposing water fluoridation have not emerged over the years.
The Great Fluoride Debate Continues
Fluoridated water supply remains widespread, with 74.4% of the population having access to fluoridated public water systems in 2014. The anti-fluoride campaign, however, is making some headway with their cause. Several cities in the US have succeeded in rejecting the addition of fluoride in their drinking water.
Their reasons for opposing community water fluoridation include fluoridation’s alleged inefficiency in preventing tooth decay and link to cancer.
Support from the Scientific Community
The scientific community and dental professional community have supported and recommended water fluoridation for many years. This includes major health agencies and departments like the:
– American Dental Association
– US Centers for Disease Control and Prevention (CDC)
– US Department of Health and Human Services (HHS)
– US Community Preventive Services Task Force
Although the opposition touts fluoride’s alleged link to a risk for cancer as a major reason to stop water fluoridation, a review of old and recent studies show it has no clear association with any form of cancer. Moreover, the CDC says water fluoridation is the most cost-efficient method of fluoride delivery and helps lower cavities by 25%.
Safeguards in Place to Protect Americans
Guidelines regarding the fluoride content in drinking water are put in place to protect public health. It’s also been reviewed to ensure the public gets a safe amount of fluoride to lessen the risk of dental fluorosis while still preventing tooth decay.
The HHS now recommends fluoride levels no more than 0.7 milligrams per liter. Previously recommended fluoride levels of between 0.7 and 1.2 milligrams per liter were modified to account for other sources of fluoride available to the public.
The scientific community and the nation’s health organizations are working together to ensure the optimal health of Americans.


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Yes, This is certainly an ambiguous description, but you can find a variety of indicators that you need to have an auto transmission repair. One of the most popular but delicate signs of necessary transmission repair is once the transmission slips or hesitates; even though driving, you press to the pedal as well as the motor revs up, but there’s no corresponding increase in speed or simply a hesitation involving whenever you press the pedal along with the car or truck hurries up. This tends to materialize notably when initial commencing the car over a colder early morning for the first time.
If your automobile vibrates When you drive, it could suggest a challenge in the motor to your tires. Find out the best main reasons why your vehicle vibrates.
Trying to Get the Kia car or truck's oil modified in Brandon, Tampa, Wesley Chapel or Tampa Bay? There are lots of spots you are able to prefer to go in the area - irrespective of whether It is a small independent shop, A further supplier, or a substantial chain.
Transmissions in present day automobiles depend closely on Digital controls and systems. For those who recognize a warning mild flashing on the instrument cluster — In particular a light that claims “O/D,” which signifies the “overdrive” gear — the auto’s on-board diagnostic technique has registered an mistake With all the transmission. P0700 is usually a code that will point out a common transmission trouble.
In addition to poor Procedure, A further indicator of a failing transmission advice could be strange vibrations or shimmying sensations when driving.
The objective of the transmission is to transfer the facility created because of the engine on the travel axle and wheels by utilizing diverse gears. An automobile’s engine rotates inside of a set selection of speeds, typically from 600 to 7,000 revolutions for each minute (rpm) for many passenger automobiles.
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Remanufacturing a transmission is actually the same as rebuilding, While using the exception that it requires location in a manufacturing facility setting.
Securely retail store your recent car or truck data and obtain applications to avoid wasting time on the the dealership.
No matter where you Obtain your auto transmission repaired or the way it’s repaired, getting a warranty or warranty to the parts and labor is A vital move.
Automatic transmissions: The most common style of automobile transmission for vehicles crafted and bought in the United States, automatic transmissions automatically pick out the correct gear to the driving circumstances. Outside of Distinctive situation like towing a trailer or extremely steep inclines or declines, most motorists simply just have to set the auto’s equipment selector into “D” for generate along with the automatic transmission does the rest.
If a repair shop or auto provider provider has proposed a pricey repair primarily based on their sole diagnosis, it could show handy to get a second impression. With a few transmission problems such as a difficulties that prevent the car from even driving, this will depict an additional price in towing the auto to a different site, so contemplate performing exercises this selection judiciously.
Hybrid automobile proprietors confront dilemma When selecting an auto mechanic because of the new motor vehicle know-how included.


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The largest non-nuclear man-made explosion occured in the maritime city of Halifax, Nova Scotia on December 6, 1917 when a troop ship collided with an ammunition ship bound for the battlefields of Europe in the city harbour.
Halifax is one of the world’s largest and deepest ice-free harbours, and during the war it became a major military installation. A large army garrison was stationed there, and a vast bureaucratic machine was set up in the city. All neutral ships bound for North America had to report to and be inspected in Halifax. As a result of these factors, the city experienced a massive growth of population and size, from 50,000 in 1914 to over 150,000 by 1917.
For 3 1/2 years the Dominion of Canada had been heavily involved in the First World War. In 1914, when Great Britain went to war, all her colonies and dominions had to do the same. During the First World War Canada rose as an industrial power in the world and supplied the British war effort with over half of her supplies, material and grain. The Canadian army, under the skilled leadership of General Arthur Currie, had gained a reputation as shock troops on the Western Front and after the stunning victory at Vimy Ridge on Easter 1917 Canadian indepedence after the war was guaranteed.
Between 1914 and 1917 Canada had also become a middle-power with her navy. As more and more supplied poured into Britain and France from their far-flung empires, Germany began to employ the feared U-boats in the mid-Atlantic. To counter the U-boat threat, ships sailed in convoys escorted by warships. By 1917 over 52% of these convoys were assembled and sailed out of Halifax until the American war machine geared up by the spring of 1918. As a result, hundreds of merchant marine ships and their escorts would be jammed into Halifax harbour when a convoy was preparing to sail or returning from Europe.
With so many vessels crammed into the harbour it was inevitable that accidents would occur. Indeed, there had been several over the years and at least two ships had sunk, one a light destroyer when it ran aground during fog, and another a coal ship which collided with a freighter in the harbour.
In 1916 an American naval observer had written a report to the Naval Department in Washington, noting that “..with the current conditions in the city and the strains on the local administration, it is only a matter of time before we are witness to a significant maritime disaster.” The demands of the war, which by late 1917 had consumed millions of men in endless trench warfare in the bloodiest attrition the world had ever seen, meant that British and Canadian authorities were helpless to change the situation in Halifax harbour.
On December 6th, 1917, the fears of many experts came true. A convoy was assembling in the harbour and ships were lazily drifting about in the water as they waited. To reach the stormy Atlantic from Halifax Harbour ships must first pass through two natural channels called the Bedford Basin. Under normal conditions traffic is heavily controlled through these channels but on this day in 1917 the chaos in the harbour only guaranteed the disaster would happen.
The steamer Imo was heading through Bedford Basin when two tugboats pulling a coal freighter nearly collide with her. Imo took evasive action and veered hard to starboard. The steamer and the freighter just barely missed colliding. Unfortunately for Imo, she had veered directly into the path of the French ammunition ship Mont-Blanc. The Mont-Blanc blasted her whistles, to which the Imo replied, both ships signalling their intent to stay on course. Unfortunately it was a head-on collision course.
At the last minute both captain’s ordered full emergency full reverse, but the sudden change in pitch in the propellers caused both ships to slide quickly into the center of the channel, momentarily out of control. The Imo hit Mont-Blanc broadside at 15 knots and embedded into her starboard side. The Imo’s captain ordered rapid changes in propeller speed to try to dislodge the two ships, and this caused the intertwined metal to spark. Unfortunately for everyone, the Mont-Blanc’s hull had been breached during the collision and these sparks found the 6,000 tonnes of ammunition she was carrying.
A large fire immediately erupted all along Mont-Blanc’s hull, and her captain ordered everyone to abandon ship. Four minutes after the collision the Imo managed to tear herself free, her bow badly damaged but her hull intact. The Mont-Blanc was a sea of flame and sailors were throwing themselves into the cold water of the channel. A large store of benzol on the Mont-Blanc’s decks exploded in a huge fireball, but this was only a preview for what was to happen next.
The Mont-Blanc burned in Bedford Basin for nearly twelve minutes. The heat from the burning ship was so intense that it could be felt on the shore, and people came down to the docks to watch the drama unfold. At that time a train loaded with families bound for Halifax to wave goodbye to their sons as they set out for France was only thirty kilometers away. At the Halifax train station a young telegraphist, seeing the inferno on the water and perhaps sensing the imminent danger, fired off an emergency message to the fast approaching train. “Immediate Stop! Do Not Enter Halifax!” His last-minute message saved the lives hundreds of civilians.
At 9:04 am the Mont-Blanc suddenly exploded with a force of 3 kilotons, equivalent to 3 Hiroshima bombs. A massive fireball rose 2 km into the air, forming a giant mushroom cloud. The shock wave flattened buildings for 5 kilometers around the harbour and triggered a massive tsunami that rose 60 metres above the harbour and swallowed hundreds of houses and people. Shards of molten metal rained down on the city and 20 kilometres away.
The effects of the shock wave and tsunami were compounded by the narrow channels of Bedford Basin, which created a funnel-like effect. Unfortunately not a single person who was watching along the shores survived, so there were no eye-witnesses to the actual explosion to interview after the fact.
In Halifax’s north-end, the blast caused oil lamps and wood-burning stoves to tip over, and a conflagration consumed the city. Nearly 1200 houses were burned down in this secondary effect of the blast.
Researchers have since discovered that the effects of the blast were felt as far away as Cape Breton Island (360 km) and even in Vermont, where windows rattled and shelves collapsed in people’s homes (this was, at the time, attributed to a minor earthquake although scientists were stumped for many years about how, when none of the usual signs of an earthquake were present. It was in the 1960s that researchers discovered the tremors in Vermont were felt at 9:07 am, three minutes after the explosion, and the blast could be traced through Maine, New Brunswick, and Nova Scotia all the way to its epicenter in Halifax Harbour).
2,000 people lost their lives in the Halifax explosion, and 15,000 were injured. Over 12,000 homes, stores and buildings were destroyed by the shock wave and tsunami and countless others damaged. Fourteen ships of the assembling convoy were sunk in the harbour, more loss of material and ships than any German U-boat had managed to inflict on a convoy. The cost of the explosion, adjusted for today’s prices, is estimated at over half a billion dollars.
The Halifax explosion has become embedded in Canadian, and particular Nova Scotia, folklore and has since spawned numerous films, documentaries, songs, books and even poems. The Mont-Blanc’s 1.5 ton anchor, which was hurled 2 kilometers away, is now a memorial in Halifax, kept exactly where it fell from the sky and embedded in the earth.

domain: geography


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- What is Mobivity Holdings Corp.'s stock symbol?
Our stock is traded on the OTCQB under the symbol MFON.
- Can I buy stock directly from Mobivity Holdings Corp.?
No, you will need to contact a licensed stock broker or use an online trading account.
- How can I buy stock in Mobivity Holdings Corp.?
Through a licensed stock broker or by using an online trading account.
- How do I change the address on my shareholder account?
Through your brokerage account or by contacting our transfer agent.
- When was Mobivity Holdings Corp. incorporated?
- When did Mobivity Holdings Corp. become a public company?
We went public in November of 2010 as CommerceTel, and then rebranded to Mobivity in the Spring of 2012.
- Where is Mobivity Holdings Corp. located?
3133 W Frye Rd
Chandler, AZ 85226
- When is Mobivity Holdings Corp.'s fiscal year end?
- Who is Mobivity Holdings Corp.'s transfer agent?
VStock Transfer LLC
18 Lafayette Place
Woodmere, NY 11598
- Who are Mobivity Holdings Corp.'s independent auditors?
M&K CPAS, PLLC
4100 North Sam Houston Pkwy W
Houston, TX 77086
- Who is Mobivity Holdings Corp.'s outside legal counsel?
Greenberg Traurig, LLP
3161 Michelson Drive
Irvine, CA 92612
- Whom can I contact for general information about Mobivity Holdings Corp.?
The Del Mar Consulting Group, Inc.
Robert B. Prag
Alex Partners, LLC


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Even without a major overhaul at the state level, education in the U.S. has slowly started to evolve into a more fluid and flexible experience that better suits families' busy lives.
Bedford Public Schools Supt. Dr. Carl Shultz knows that nobody likes the sound of the words ‘year-round school’.
“Balanced calendar is kind of a new-age, friendly term,” he said.
Call it what you want, the idea is that several smaller breaks will be distributed throughout the school year in favor of the current, months-long summer vacation. Many educators believe that a major shakeup of the United States’ archaic school calendar is inevitable.
It certainly won’t happen tomorrow - no districts in Monroe County are actively exploring the concept - but as state governments continue to require districts to be in session for more days and longer hours, the concept of breaking up the traditional summer vacation into several one- or two-week breaks will look more and more appealing.
Even without a major overhaul at the state level, education in the U.S. has slowly started to evolve into a more fluid and flexible experience that better suits families’ busy lives. Monroe Public Schools Supt. Julie Everly sees that trend continuing.
“I think more and more we will see very flexible learning options for families and children,” she said. “I do think we’ll see more of what looks like a balanced calendar and more flexibility in school hours. “
The current school schedule widely used across the country can be traced back to America’s agricultural roots. Children simply needed to be out of school in the summer so they could help out around the farm.
Over the decades, more and more of that summer break has slowly been incorporated into the school calendar. Before the 2012-13 school year, the State of Michigan increased the number of days it required schools to be in session from 165 to 170. It increased to 175 shortly after, and in 2016 it rose to 180.flexible learning
The concern, among educators and elected officials, is that kids are losing too much of what they’ve learned in school over the months-long summer break.
“We know there’s a summer slide,” Shultz said. “It’s real. If you don’t use what you have learned, you’re going to have to be retaught at some point. It kind of slows down the pace for growth.”
Of course, there are some students who don’t stop learning simply because they aren’t in class.
Amanda LaMontaine’s two young sons – seven-year-old Maddox, and six-year-old Kase – spent the summer traveling the country to visit extended family. Along the way they took time for educational pit stops, including a trip to the Grand Canyon.
It was an experience that just can’t be captured in a textbook that the boys would read in their classes at Sodt Elementary School.
“This is a vacation they usually wouldn’t be able to go on during the school year,” LaMontaine said. “They still learned stuff, and they came back with so much information they might not have picked up at school.”
Gibraltar Carlson educator Michael Pehote and his family try to take a family trip each year around the Fourth of July holiday. Pehote and his wife want their two kids to experience new things on these trips, so they make a point to never visit the same place twice.
This summer the family visited Punta Cana in the Dominican Republic.
“It’s the first time the kids have needed passports, the first time they’ve left the country, so that was a big change,” Pehote said. “That’s sort of how I was raised… My wife and I, we try to do something different every summer. We’re the type of people who don’t like to do the same thing over and over.”
Pehote also knows that the opportunities for these types of trips are fleeting. His daughter is 14 and his son is 12, and they’re both involved in sports.
“It’s crazy how fast the years go by,” he said. “Pretty soon, the kids won’t be here for these trips. It goes fast, you know?”
Shultz recognizes the importance of this type of quality family time, and added that he considers any time that parents are spending with their children to be educational. But he acknowledged that for every student traveling to the Grand Canyon or out of the country, there’s another sitting at home alone playing Xbox all day long.
This diversity in students’ summer plans may lead to more and more districts adapting flexible learning programs such as Monroe’s Summer Learning Academy. With varied lessons and activities, such as vocational experiences and performing arts workshops, MPS students are able to extend learning beyond the classroom without the rigid structure of traditional school semesters.
“Previously, a lot of people thought about the summer school model that you and I might have experienced, where students who were behind on their studies used summer school to catch up,” Everly said.
“This model is very different. Although we have some students who engage in it in hopes to catch up on some things they may not have picked up during the school year, many of our students are at and above grade level. They really come because they love school…”
The reality is that most districts won’t consider switching to a true balanced schedule unless it is required by the state government. There are too many logistical hang-ups that make such a transition next to impossible to enact in a single county, let alone an individual district.
How would school sports work, for example, if one district is on a balanced schedule and all of its opponents were still using traditional calendars? How would districts without air conditioning across all of their buildings afford to install the expensive HVAC systems necessary to keep students and faculty cool during the dog days of summer?
“The biggest challenge to that concept is that it’s not the norm,” Shultz said. “When you talk about students and programming, athletics and arts programs, they’re really geared toward the premise that everyone has break around the same time.”
Until massive changes happen at the state level, individual districts will continue to find creative ways to encourage students to spend at least some of their precious summer vacation learning something new.
At the very least, educators hope to help kids retain the knowledge they spent the past school year accumulating. But that process doesn’t necessarily have to happen in a traditional classroom setting.
“I think that the balanced calendar is part of a bigger trend in education that is really like learning any time, any place,” Everly said. “I would say that it is part of that.”


The US Air Force’s F-22 Raptor, which was supposed to replace the F-15 fleet, is perhaps the most operationally capable fifth-generation air superiority fighter in the world.
The twin-engine aircraft was designed as a heavy-duty stealth fighter, much more matured than the current generation F-35s.
The F-22 Raptor made its first flight in 1997 and was inducted into the US Air Force in 2005, at a time when most countries were struggling to develop more credible fourth-generation platforms.
In a new video released, an F-22’s potential is seen as it simultaneously takes on five F-15 fighters, effectively dominating the skies alone. This capability is still unmatched by any fighter jet in the world, and the Raptor shall remain undisputed king in air-to-air combat at least until 2025.
The USAF initially wanted to purchase 750 F-22s, following which it was downed to 381 and then subsequently the production was halted at 183. The last F-22 was delivered by Lockheed Martin in 2012.
It seems a rather interesting subject that an aircraft that was perhaps the most advanced and the most groundbreaking in the annals of aviation history saw an abrupt halt. To compare, the F-22’s radar signature is still less than the more digitally advanced F-35, according to WeAreTheMighty.
The F-22 was intended as a replacement for the F-15s. However, the F-15 development continued to take place with the latest variant being the F-15EX Eagle II, but the production of Raptors stopped abruptly because of several factors.
The main reason was the lack of clarity on Russian and Chinese fifth-generation fighter development, which made the US less focused on stealth air superiority fighters.
The other reason was the high costs, and the eventual development of the F-35, made with the expertise gained on the Raptor.
While some critics pegged its cost at over $300 million a plane, the actual fly-away cost could go down to $116 million per Raptor, according to a 2006 Air Force release.
But, until the F-35 platform is fully developed, the F-22 Raptor remains the king of the skies for the US Air Force.
The aircraft can carry a robust complement of 4 AIM-120 AMRAAMs and 4 AIM-9 Sidewinder missiles in the air superiority configuration and also an internal 20mm cannon.
It can also launch air-to-surface weapons such as bombs with JDAM guidance and the small diameter bomb, but cannot self-designate for laser-guided weapons.
Had this platform been given more time to mature, it could have offered a lot more. And then, it could have been a better option than throwing funds for the F-35, according to experts.
But, global sales have always been a driving factor for Washington, which made the development of F-35s inevitable.


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