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Synthetic MVTec AD – Defect Detection Dataset by AnywayLabs.ai
Need a custom synthetic dataset for your own defect detection use case?
This dataset is an open-source sample of our synthetic data generation work at AnywayLabs.
If you're working on:
- industrial defect detection
- visual inspection
- supervised anomaly detection
- hard-to-collect defect classes
- synthetic data for computer vision training
You can request a custom synthetic dataset here, or email: contact@anywaylabs.ai
Dataset Summary
This dataset contains fully synthetic defect images for industrial inspection, inspired by the MVTec AD dataset generated by AnywayLabs.ai.
Unlike the original MVTec AD dataset, which is designed for anomaly detection (train on good, test on defects), this dataset reformulates the problem as a supervised object detection task with labeled defect instances.
The dataset focuses on realistic defect simulation across industrial objects and is designed to generalize to real-world defect detection scenarios.
Key Features
- Fully synthetic defect dataset
- Supervised object detection formulation
- YOLO-format annotations
- Validated on real MVTec AD defect images
- Object-specific datasets (e.g., transistor, bottle, cable)
Synthetic vs Real Comparison
| Synthetic | Real |
|---|---|
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Dataset Structure
Format
- Task: Object Detection (Defect Detection)
- Annotation Format: YOLO (normalized bounding boxes)
- Image Resolution: 640 x 640
Directory Structure
object_name/
images/
train/
val/
labels/
train/
val/
data.yaml
Example (Transistor Dataset)
- Number of Classes: 4
Classes:
- bent_lead
- cut_lead
- damaged_case
- misplaced
Splits
- Train: Synthetic defect images
- Validation: Real defect images (from MVTec AD, in full setup)
Data Generation
The dataset is generated using a AnywayLabs.ai's proprietary synthetic dataset generation framework.
Capabilities
Defect-level control:
- Type (e.g., cut, bend, damage)
- Size and severity
- Placement on object
Scene-level control:
- Lighting conditions
- Surface texture variation
- Material consistency
Structural consistency:
- Object geometry preserved
- Realistic defect integration (not simple overlays)
Design Philosophy
Instead of replicating real data exactly, the dataset is designed to:
- Expand the defect distribution beyond limited real samples
- Introduce controlled variation across defect appearance
- Improve robustness to unseen real-world defects
Annotation Process
Bounding boxes are generated for each defect instance
Labels follow YOLO format:
class_id x_center y_center width height
Bounding box tightness is manually corrected
Annotation consistency is maintained across all samples
Limitations
- Real validation datasets are small and not fully representative
- Performance varies across object categories and defect complexity
- Bounding boxes may not capture fine-grained defect shapes (compared to segmentation)
Usage
Recommended Use Cases
- Defect detection model training
- Synthetic pretraining before fine-tuning on real data
- Industrial inspection system development
Compatible Frameworks
- Ultralytics YOLO (recommended)
- Detectron2 (after conversion)
- Any YOLO-compatible pipeline
Comparison with MVTec AD
| Feature | MVTec AD | This Dataset |
|---|---|---|
| Training Data | Mostly "good" images | Defect images |
| Task Type | Anomaly Detection | Object Detection |
| Labels | Segmentation masks (test only) | Bounding boxes |
| Defect Count | ~25 per class | Scalable |
| Training Paradigm | Unsupervised | Fully supervised |
Need a custom synthetic dataset for your own defect detection use case?
This dataset is an open-source sample of our synthetic data generation work at AnywayLabs.
If you're working on:
- industrial defect detection
- visual inspection
- supervised anomaly detection
- hard-to-collect defect classes
- synthetic data for computer vision training
You can request a custom synthetic dataset here, or email: contact@anywaylabs.ai
Citation
If you use this dataset, please cite:
Synthetic MVTec AD Dataset – AnywayLabs.ai
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