messages listlengths 3 3 | source_file stringclasses 36
values | chunk_id int64 0 92 |
|---|---|---|
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\n) Amplitude and phase of the complex modulation index for a n... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 9 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\n) Amplitude and phase of the complex modulation index for a n... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 9 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nroaching the cantilever bandwidth ωc. In Figure 2a, we show t... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 10 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nroaching the cantilever bandwidth ωc. In Figure 2a, we show t... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 10 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nroaching the cantilever bandwidth ωc. In Figure 2a, we show t... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 10 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nw-pass filter of the lock-in amplifier (solid, fcut = 250 Hz,... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 11 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nw-pass filter of the lock-in amplifier (solid, fcut = 250 Hz,... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 11 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nw-pass filter of the lock-in amplifier (solid, fcut = 250 Hz,... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 11 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\ne in-phase components, taking into account the 180° phase shi... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 12 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\ne in-phase components, taking into account the 180° phase shi... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 12 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\ne in-phase components, taking into account the 180° phase shi... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 12 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nlot the ratio of the ωm and 2ωm sideband amplitudes, normalis... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 13 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nlot the ratio of the ωm and 2ωm sideband amplitudes, normalis... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 13 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nlot the ratio of the ωm and 2ωm sideband amplitudes, normalis... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 13 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nanges in C'' and only depends on the chosen modulation amplit... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 14 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nanges in C'' and only depends on the chosen modulation amplit... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 14 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nanges in C'' and only depends on the chosen modulation amplit... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 14 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nk therefore leads to errors in the measured CPD, constituting... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 15 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nk therefore leads to errors in the measured CPD, constituting... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 15 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nk therefore leads to errors in the measured CPD, constituting... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 15 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nfollowing section we introduce a novel Kelvin feedback scheme... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 16 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nfollowing section we introduce a novel Kelvin feedback scheme... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 16 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nfollowing section we introduce a novel Kelvin feedback scheme... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 16 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nferential (PID) controller, and b) the Kalman filter. In the ... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 17 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nferential (PID) controller, and b) the Kalman filter. In the ... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 17 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nferential (PID) controller, and b) the Kalman filter. In the ... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 17 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nof the demodulating lock-in amplifier. Since the lock-in band... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 18 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nof the demodulating lock-in amplifier. Since the lock-in band... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 18 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nof the demodulating lock-in amplifier. Since the lock-in band... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 18 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nariances [42]. This recursive predictor–corrector structure a... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 19 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nariances [42]. This recursive predictor–corrector structure a... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 19 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nariances [42]. This recursive predictor–corrector structure a... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 19 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nosed-loop response of the Kelvin observer (black) and a propo... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 20 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nosed-loop response of the Kelvin observer (black) and a propo... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 20 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nosed-loop response of the Kelvin observer (black) and a propo... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 20 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nh coarse topography one may use AM topography feedback to avo... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 21 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nh coarse topography one may use AM topography feedback to avo... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 21 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nh coarse topography one may use AM topography feedback to avo... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 21 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nance, for example as field effect transistors. Figure 9b disp... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 22 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nance, for example as field effect transistors. Figure 9b disp... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 22 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nance, for example as field effect transistors. Figure 9b disp... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 22 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nat the boundaries of the nanowire. Long-range potential avera... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 23 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nat the boundaries of the nanowire. Long-range potential avera... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 23 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nat the boundaries of the nanowire. Long-range potential avera... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 23 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nrmance on the nanowire. The integral controller exhibits ring... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 24 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nrmance on the nanowire. The integral controller exhibits ring... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 24 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nrmance on the nanowire. The integral controller exhibits ring... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 24 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\ncould perform these scans with amplitude modulation in air. S... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 25 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\ncould perform these scans with amplitude modulation in air. S... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 25 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\ncould perform these scans with amplitude modulation in air. S... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 25 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nessive lines in AFM scans only change slightly, information f... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 26 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nessive lines in AFM scans only change slightly, information f... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 26 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nessive lines in AFM scans only change slightly, information f... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 26 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\n, H. F.; Stemmer, A. Rev. Sci. Instrum. 1999, 70, 1756–1760. ... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 27 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\n, H. F.; Stemmer, A. Rev. Sci. Instrum. 1999, 70, 1756–1760. ... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 27 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\n, H. F.; Stemmer, A. Rev. Sci. Instrum. 1999, 70, 1756–1760. ... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 27 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nl. Surf. Sci. 1999, 140, 265–270. doi:10.1016/S0169-4332(98)0... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 28 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nl. Surf. Sci. 1999, 140, 265–270. doi:10.1016/S0169-4332(98)0... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 28 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nl. Surf. Sci. 1999, 140, 265–270. doi:10.1016/S0169-4332(98)0... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 28 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\n.; de Man, S.; Wijngaarden, R. J. Rev. Sci. Instrum. 2014, 85... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 29 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\n.; de Man, S.; Wijngaarden, R. J. Rev. Sci. Instrum. 2014, 85... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 29 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\n.; de Man, S.; Wijngaarden, R. J. Rev. Sci. Instrum. 2014, 85... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 29 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nrovided the original work is properly cited. The license is s... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 30 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nrovided the original work is properly cited. The license is s... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 30 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nrovided the original work is properly cited. The license is s... | v2/v2/1082/Wagner et al. - 2015 - Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.pdf | 30 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nThe impact of Kelvin probe force microscopy operation modes a... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 0 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nThe impact of Kelvin probe force microscopy operation modes a... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 0 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nThe impact of Kelvin probe force microscopy operation modes a... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 0 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nrast due to the polycrystalline nature of the absorbers. Keyw... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 1 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nrast due to the polycrystalline nature of the absorbers. Keyw... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 1 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nrast due to the polycrystalline nature of the absorbers. Keyw... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 1 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\n(KPFM) [20–23]. In this work, we focus on one particular scan... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 2 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\n(KPFM) [20–23]. In this work, we focus on one particular scan... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 2 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\n(KPFM) [20–23]. In this work, we focus on one particular scan... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 2 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nunder ambient conditions and Frequency Modulation KPFM (FM-KP... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 3 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nunder ambient conditions and Frequency Modulation KPFM (FM-KP... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 3 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nunder ambient conditions and Frequency Modulation KPFM (FM-KP... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 3 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nried out in a molecular beam epitaxy system (MBE). Details of... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 4 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nried out in a molecular beam epitaxy system (MBE). Details of... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 4 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nried out in a molecular beam epitaxy system (MBE). Details of... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 4 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nAM-KPFM is easier to implement and that this method has a bet... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 5 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nAM-KPFM is easier to implement and that this method has a bet... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 5 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nAM-KPFM is easier to implement and that this method has a bet... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 5 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nain surfaces (CPDGrain) as a function of the reported PCE for... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 6 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nain surfaces (CPDGrain) as a function of the reported PCE for... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 6 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nain surfaces (CPDGrain) as a function of the reported PCE for... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 6 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\ns, and high non-radiative recombination rates (see for exampl... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 7 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\ns, and high non-radiative recombination rates (see for exampl... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 7 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\ns, and high non-radiative recombination rates (see for exampl... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 7 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nvalues only range up to several hundred nanometers. Consequen... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 8 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nvalues only range up to several hundred nanometers. Consequen... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 8 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nvalues only range up to several hundred nanometers. Consequen... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 8 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nion map, where variations of around 250 mV between facets cou... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 9 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nion map, where variations of around 250 mV between facets cou... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 9 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nion map, where variations of around 250 mV between facets cou... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 9 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nn measurements are carried out under ambient conditions where... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 10 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nn measurements are carried out under ambient conditions where... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 10 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nn measurements are carried out under ambient conditions where... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 10 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nforce acting between the cantilever and the sample can be di-... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 11 |
[
{
"role": "system",
"content": "You are a research assistant. Answer using ONLY the provided context. If the answer is not in the context, say exactly: Not enough information in the context."
},
{
"role": "user",
"content": "Context:\nforce acting between the cantilever and the sample can be di-... | v2/v2/1091/Lanzoni et al. - 2021 - The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band b.pdf | 11 |
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