{
 "nodes": {
  "term-33f7d390": {
   "product": "水機/冰水主機",
   "aliases": [
    "CWP"
   ],
   "keywords": [
    "冷卻水泵",
    "Condenser Water Pump",
    "CWP"
   ],
   "en": "Condenser Water Pump",
   "layer": "vault",
   "content": "冷卻水泵（Condenser Water Pump）：將冷卻水在冷凝器與冷卻塔之間循環輸送的泵浦。",
   "node_type": "Term",
   "domain": "水機/冰水主機",
   "term": "冷卻水泵",
   "definition": "將冷卻水在冷凝器與冷卻塔之間循環輸送的泵浦。",
   "id": "term-33f7d390",
   "category": "輸送設備",
   "who": "glossary"
  },
  "term-49efcc99": {
   "product": "水機/冰水主機",
   "aliases": [
    "冰水主機",
    "Chiller Unit"
   ],
   "keywords": [
    "冷水機組",
    "Chiller",
    "冰水主機",
    "Chiller Unit"
   ],
   "en": "Chiller",
   "content": "冷水機組（Chiller）：利用壓縮機與製冷劑循環產生低溫冷水的核心設備。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "水機/冰水主機",
   "term": "冷水機組",
   "definition": "利用壓縮機與製冷劑循環產生低溫冷水的核心設備。",
   "id": "term-49efcc99",
   "category": "核心設備",
   "who": "glossary"
  },
  "term-e57a7896": {
   "product": "水機/冰水主機",
   "aliases": [
    "Evap"
   ],
   "keywords": [
    "蒸發器",
    "Evaporator",
    "Evap"
   ],
   "en": "Evaporator",
   "content": "蒸發器（Evaporator）：製冷劑吸收冷水熱量而蒸發，使冷水降溫的熱交換器。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "水機/冰水主機",
   "term": "蒸發器",
   "definition": "製冷劑吸收冷水熱量而蒸發，使冷水降溫的熱交換器。",
   "id": "term-e57a7896",
   "category": "熱交換設備",
   "who": "glossary"
  },
  "term-a2edbea2": {
   "product": "水機/冰水主機",
   "aliases": [
    "Cond"
   ],
   "keywords": [
    "冷凝器",
    "Condenser",
    "Cond"
   ],
   "en": "Condenser",
   "content": "冷凝器（Condenser）：將製冷劑中的熱量傳遞給冷卻水，使製冷劑冷凝為液體的設備。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "水機/冰水主機",
   "term": "冷凝器",
   "definition": "將製冷劑中的熱量傳遞給冷卻水，使製冷劑冷凝為液體的設備。",
   "id": "term-a2edbea2",
   "category": "熱交換設備",
   "who": "glossary"
  },
  "term-1d8f237f": {
   "product": "水機/冰水主機",
   "aliases": [
    "CHW Loop",
    "冷水迴路"
   ],
   "keywords": [
    "冷卻水循環系統",
    "Chilled Water Loop",
    "CHW Loop",
    "冷水迴路"
   ],
   "en": "Chilled Water Loop",
   "layer": "vault",
   "content": "冷卻水循環系統（Chilled Water Loop）：冷水在主機與末端負荷（如空調箱）之間循環的閉路系統。",
   "node_type": "Term",
   "domain": "水機/冰水主機",
   "term": "冷卻水循環系統",
   "definition": "冷水在主機與末端負荷（如空調箱）之間循環的閉路系統。",
   "id": "term-1d8f237f",
   "category": "系統架構",
   "who": "glossary"
  },
  "term-fbd938ef": {
   "product": "通用設備可靠度(FMEA)",
   "aliases": [
    "FMEA"
   ],
   "keywords": [
    "失效模式與影響分析",
    "Failure Mode and Effects Analysis",
    "FMEA"
   ],
   "en": "Failure Mode and Effects Analysis",
   "content": "失效模式與影響分析（Failure Mode and Effects Analysis）：一種系統化地分析潛在失效模式及其對系統影響的風險評估方法。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "通用設備可靠度(FMEA)",
   "term": "失效模式與影響分析",
   "definition": "一種系統化地分析潛在失效模式及其對系統影響的風險評估方法。",
   "id": "term-fbd938ef",
   "category": "分析方法",
   "who": "glossary"
  },
  "term-0a55fab1": {
   "product": "通用設備可靠度(FMEA)",
   "aliases": [
    "RPN"
   ],
   "keywords": [
    "風險優先數",
    "Risk Priority Number",
    "RPN"
   ],
   "en": "Risk Priority Number",
   "layer": "vault",
   "content": "風險優先數（Risk Priority Number）：由嚴重度、發生率與偵測度三項指標相乘而得的數值，用於排列風險優先順序。",
   "node_type": "Term",
   "domain": "通用設備可靠度(FMEA)",
   "term": "風險優先數",
   "definition": "由嚴重度、發生率與偵測度三項指標相乘而得的數值，用於排列風險優先順序。",
   "id": "term-0a55fab1",
   "category": "評估指標",
   "who": "glossary"
  },
  "term-b2872eaa": {
   "product": "通用設備可靠度(FMEA)",
   "aliases": [
    "S"
   ],
   "keywords": [
    "嚴重度",
    "Severity",
    "S"
   ],
   "en": "Severity",
   "content": "嚴重度（Severity）：評估單一失效模式對最終用戶或系統造成的影響程度。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "通用設備可靠度(FMEA)",
   "term": "嚴重度",
   "definition": "評估單一失效模式對最終用戶或系統造成的影響程度。",
   "id": "term-b2872eaa",
   "category": "評估指標",
   "who": "glossary"
  },
  "term-aa027394": {
   "product": "通用設備可靠度(FMEA)",
   "aliases": [
    "O"
   ],
   "keywords": [
    "發生率",
    "Occurrence",
    "O"
   ],
   "en": "Occurrence",
   "content": "發生率（Occurrence）：評估特定失效原因導致失效模式出現的頻率或可能性。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "通用設備可靠度(FMEA)",
   "term": "發生率",
   "definition": "評估特定失效原因導致失效模式出現的頻率或可能性。",
   "id": "term-aa027394",
   "category": "評估指標",
   "who": "glossary"
  },
  "term-11014b99": {
   "product": "通用設備可靠度(FMEA)",
   "aliases": [
    "D"
   ],
   "keywords": [
    "偵測度",
    "Detection",
    "D"
   ],
   "en": "Detection",
   "content": "偵測度（Detection）：評估在產品交付給客戶前，現有控制措施發現失效模式的能力。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "通用設備可靠度(FMEA)",
   "term": "偵測度",
   "definition": "評估在產品交付給客戶前，現有控制措施發現失效模式的能力。",
   "id": "term-11014b99",
   "category": "評估指標",
   "who": "glossary"
  },
  "term-09197362": {
   "product": "通用設備可靠度(FMEA)",
   "aliases": [
    "Failure State"
   ],
   "keywords": [
    "失效模式",
    "Failure Mode",
    "Failure State"
   ],
   "en": "Failure Mode",
   "layer": "vault",
   "content": "失效模式（Failure Mode）：設備或組件無法執行其預定功能而導致的具體故障狀態。",
   "node_type": "Term",
   "domain": "通用設備可靠度(FMEA)",
   "term": "失效模式",
   "definition": "設備或組件無法執行其預定功能而導致的具體故障狀態。",
   "id": "term-09197362",
   "category": "核心概念",
   "who": "glossary"
  },
  "term-46ef0fda": {
   "product": "半導體製程",
   "aliases": [
    "CD"
   ],
   "keywords": [
    "臨界尺寸",
    "Critical Dimension (CD)",
    "CD"
   ],
   "en": "Critical Dimension (CD)",
   "layer": "vault",
   "content": "臨界尺寸（Critical Dimension (CD)）：微影/蝕刻後圖形的關鍵線寬",
   "node_type": "Term",
   "domain": "半導體製程",
   "term": "臨界尺寸",
   "definition": "微影/蝕刻後圖形的關鍵線寬",
   "id": "term-46ef0fda",
   "category": "量測",
   "who": "glossary"
  },
  "term-ab1a7e37": {
   "product": "水機/冰水主機",
   "aliases": [
    "CD"
   ],
   "keywords": [
    "冷凝器",
    "Condenser",
    "CD"
   ],
   "en": "Condenser",
   "layer": "vault",
   "content": "冷凝器（Condenser）：冰水主機中冷媒散熱冷凝的熱交換器",
   "node_type": "Term",
   "domain": "水機/冰水主機",
   "term": "冷凝器",
   "definition": "冰水主機中冷媒散熱冷凝的熱交換器",
   "id": "term-ab1a7e37",
   "category": "元件",
   "who": "glossary"
  },
  "defect-el180-break": {
   "machine_type": "EL-180",
   "product": "EL-180",
   "node_type": "Defect",
   "keywords": [
    "整經",
    "斷紗",
    "張力",
    "彈性紗"
   ],
   "id": "defect-el180-break",
   "when": "2025-11",
   "layer": "vault",
   "content": "EL-180 彈性紗整經斷紗，疑高張力造成",
   "who": "老陳"
  },
  "recipe-el180-good": {
   "machine_type": "EL-180",
   "product": "EL-180",
   "node_type": "Recipe",
   "keywords": [
    "張力",
    "車速",
    "彈性紗",
    "整經"
   ],
   "id": "recipe-el180-good",
   "params": "{\"tension_cN\": 14, \"speed_pct\": -8}",
   "when": "2025-11",
   "layer": "vault",
   "content": "EL-180 整經：張力 18→14cN、車速 −8%",
   "who": "老陳"
  },
  "outcome-el180-good": {
   "machine_type": "EL-180",
   "product": "EL-180",
   "keywords": [
    "斷紗率"
   ],
   "when": "2025-11",
   "content": "斷紗率 4.2%→0.7%",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "斷紗率",
   "id": "outcome-el180-good",
   "value": "4.2%→0.7%",
   "status": "success",
   "who": "老陳"
  },
  "recipe-el180-bad": {
   "machine_type": "EL-180",
   "product": "EL-180",
   "node_type": "Recipe",
   "keywords": [
    "車速",
    "產能"
   ],
   "id": "recipe-el180-bad",
   "params": "{\"speed_pct\": 15}",
   "when": "2025-11",
   "layer": "vault",
   "content": "EL-180 嘗試車速 +15% 提產能",
   "who": "老陳"
  },
  "outcome-el180-bad": {
   "machine_type": "EL-180",
   "product": "EL-180",
   "keywords": [
    "車速",
    "斷紗率"
   ],
   "when": "2025-11",
   "layer": "vault",
   "content": "車速 +15% 使斷紗率惡化（失效做法）",
   "node_type": "Outcome",
   "metric": "斷紗率",
   "id": "outcome-el180-bad",
   "value": "惡化",
   "status": "failure",
   "who": "老陳"
  },
  "recipe-el180-slow": {
   "machine_type": "EL-180",
   "product": "EL-180",
   "node_type": "Recipe",
   "keywords": [
    "車速",
    "降速"
   ],
   "id": "recipe-el180-slow",
   "params": "{\"speed_pct\": -18}",
   "when": "2025-11",
   "layer": "vault",
   "content": "EL-180 嘗試車速 −18% 求穩",
   "who": "老陳"
  },
  "outcome-el180-slow": {
   "machine_type": "EL-180",
   "product": "EL-180",
   "keywords": [
    "車速",
    "產能"
   ],
   "when": "2025-11",
   "layer": "vault",
   "content": "車速 −18% 過度降速，產能崩潰（失效做法，但在物理限內）",
   "node_type": "Outcome",
   "metric": "產能",
   "id": "outcome-el180-slow",
   "value": "崩潰",
   "status": "failure",
   "who": "老陳"
  },
  "defect-177e552e": {
   "machine_type": "EL-180",
   "product": "EL-180",
   "node_type": "Defect",
   "keywords": [
    "整經",
    "EL-180",
    "斷紗"
   ],
   "id": "defect-177e552e",
   "when": "2026",
   "content": "EL-180 斷紗（彈性紗張力設定過高，導致高速捲繞時紗線達到極限延伸率而斷裂。）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-44c9bdd5": {
   "machine_type": "EL-180",
   "product": "EL-180",
   "node_type": "Recipe",
   "keywords": [
    "整經",
    "EL-180"
   ],
   "id": "recipe-44c9bdd5",
   "params": "{\"張力\": \"35 cN\", \"車速\": \"80%\"}",
   "when": "2026",
   "content": "EL-180 解法：降低張力設定值，並適度調降車速以穩定紗線張力。",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-856e73c6": {
   "machine_type": "EL-180",
   "product": "EL-180",
   "keywords": [
    "斷紗率"
   ],
   "when": "2026",
   "layer": "vault",
   "content": "斷紗率 12.5%→1.2%",
   "node_type": "Outcome",
   "metric": "斷紗率",
   "id": "outcome-856e73c6",
   "value": "12.5%→1.2%",
   "status": "success",
   "who": "bulk"
  },
  "defect-99df8b40": {
   "machine_type": "NX-220",
   "product": "NX-220",
   "node_type": "Defect",
   "keywords": [
    "整經",
    "NX-220",
    "張力不均"
   ],
   "id": "defect-99df8b40",
   "when": "2026",
   "content": "NX-220 張力不均（紗架導紗輪磨損導致摩擦力不一，且張力補償參數設定過低。）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-f63f73b7": {
   "machine_type": "NX-220",
   "product": "NX-220",
   "node_type": "Recipe",
   "keywords": [
    "整經",
    "NX-220"
   ],
   "id": "recipe-f63f73b7",
   "params": "{\"上漿濃度\": \"15%\", \"張力\": \"45 cN\"}",
   "when": "2026",
   "content": "NX-220 解法：嘗試僅透過增加上漿濃度來增加紗線強度，未更換損毀導輪。",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-cf97b222": {
   "machine_type": "NX-220",
   "product": "NX-220",
   "keywords": [
    "張力標準差"
   ],
   "when": "2026",
   "content": "張力標準差 4.2 cN→3.8 cN",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "張力標準差",
   "id": "outcome-cf97b222",
   "value": "4.2 cN→3.8 cN",
   "status": "failure",
   "who": "bulk"
  },
  "defect-d11c8a8c": {
   "machine_type": "CT-100",
   "product": "CT-100",
   "node_type": "Defect",
   "keywords": [
    "整經",
    "CT-100",
    "毛羽過多"
   ],
   "id": "defect-d11c8a8c",
   "when": "2026",
   "content": "CT-100 毛羽過多（棉紗在高速運行時與導紗件摩擦過劇，且缺乏適當的上漿潤滑。）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-928c3e20": {
   "machine_type": "CT-100",
   "product": "CT-100",
   "node_type": "Recipe",
   "keywords": [
    "整經",
    "CT-100"
   ],
   "id": "recipe-928c3e20",
   "params": "{\"上漿量\": \"2.5%\", \"車速\": \"70%\"}",
   "when": "2026",
   "content": "CT-100 解法：增加上漿劑噴塗量並降低車速，減少機械摩擦產生的毛羽。",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-8317d430": {
   "machine_type": "CT-100",
   "product": "CT-100",
   "keywords": [
    "毛羽長度(mm)"
   ],
   "when": "2026",
   "layer": "vault",
   "content": "毛羽長度(mm) 8.5→3.2",
   "node_type": "Outcome",
   "metric": "毛羽長度(mm)",
   "id": "outcome-8317d430",
   "value": "8.5→3.2",
   "status": "success",
   "who": "bulk"
  },
  "defect-a7ebb012": {
   "machine_type": "SP-90",
   "product": "SP-90",
   "node_type": "Defect",
   "keywords": [
    "整經",
    "SP-90",
    "跳紗"
   ],
   "id": "defect-a7ebb012",
   "when": "2026",
   "content": "SP-90 跳紗（絲紗表面過滑，且紗架張力過低導致紗線在捲繞時發生位移。）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-3cd3aeef": {
   "machine_type": "SP-90",
   "product": "SP-90",
   "node_type": "Recipe",
   "keywords": [
    "整經",
    "SP-90"
   ],
   "id": "recipe-3cd3aeef",
   "params": "{\"張力\": \"55 cN\", \"車速\": \"90%\"}",
   "when": "2026",
   "content": "SP-90 解法：提高初始張力，確保紗線在捲繞過程中保持緊繃狀態。",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-f0c3f84f": {
   "machine_type": "SP-90",
   "product": "SP-90",
   "keywords": [
    "跳紗發生率"
   ],
   "when": "2026",
   "layer": "vault",
   "content": "跳紗發生率 5.0%→0.4%",
   "node_type": "Outcome",
   "metric": "跳紗發生率",
   "id": "outcome-f0c3f84f",
   "value": "5.0%→0.4%",
   "status": "success",
   "who": "bulk"
  },
  "defect-cd8f3d2c": {
   "machine_type": "EL-200",
   "product": "EL-200",
   "node_type": "Defect",
   "keywords": [
    "整經",
    "EL-200",
    "捲繞不良"
   ],
   "id": "defect-cd8f3d2c",
   "when": "2026",
   "content": "EL-200 捲繞不良（彈性紗張力波動過大，導致成品筒紗邊緣鬆散。）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-d1dd8a86": {
   "machine_type": "EL-200",
   "product": "EL-200",
   "node_type": "Recipe",
   "keywords": [
    "整經",
    "EL-200"
   ],
   "id": "recipe-d1dd8a86",
   "params": "{\"車速\": \"110%\", \"張力\": \"40 cN\"}",
   "when": "2026",
   "content": "EL-200 解法：大幅提高車速以利用離心力壓實紗線，但忽略了張力控制。",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-41f727d2": {
   "machine_type": "EL-200",
   "product": "EL-200",
   "keywords": [
    "筒紗密度(g/cm3)"
   ],
   "when": "2026",
   "content": "筒紗密度(g/cm3) 0.85→0.82",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "筒紗密度(g/cm3)",
   "id": "outcome-41f727d2",
   "value": "0.85→0.82",
   "status": "failure",
   "who": "bulk"
  },
  "defect-e4f8115d": {
   "machine_type": "NX-220",
   "product": "NX-220",
   "node_type": "Defect",
   "keywords": [
    "整經",
    "NX-220",
    "斷紗"
   ],
   "id": "defect-e4f8115d",
   "when": "2026",
   "content": "NX-220 斷紗（絲紗在高速下產生靜電導致紗線相互黏附而斷裂。）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-ac8ee6a3": {
   "machine_type": "NX-220",
   "product": "NX-220",
   "node_type": "Recipe",
   "keywords": [
    "整經",
    "NX-220"
   ],
   "id": "recipe-ac8ee6a3",
   "params": "{\"上漿抗靜電劑\": \"0.5%\", \"車速\": \"75%\"}",
   "when": "2026",
   "content": "NX-220 解法：調整上漿配方增加抗靜電劑，並將車速調至穩定區間。",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-4bbc79a1": {
   "machine_type": "NX-220",
   "product": "NX-220",
   "keywords": [
    "斷紗次數/1000m"
   ],
   "when": "2026",
   "layer": "vault",
   "content": "斷紗次數/1000m 18→3",
   "node_type": "Outcome",
   "metric": "斷紗次數/1000m",
   "id": "outcome-4bbc79a1",
   "value": "18→3",
   "status": "success",
   "who": "bulk"
  },
  "defect-8d32084e": {
   "machine_type": "W-300",
   "product": "W-300",
   "node_type": "Defect",
   "keywords": [
    "織造",
    "W-300",
    "斷經"
   ],
   "id": "defect-8d32084e",
   "when": "2026",
   "content": "W-300 斷經（經紗張力過高導致紗線在開口過程中達到極限強度而斷裂）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-88a4ee35": {
   "machine_type": "W-300",
   "product": "W-300",
   "node_type": "Recipe",
   "keywords": [
    "織造",
    "W-300"
   ],
   "id": "recipe-88a4ee35",
   "params": "{\"經紗張力\": \"250g → 200g\"}",
   "when": "2026",
   "content": "W-300 解法：調低經紗張力，增加紗線延展空間",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-4561813e": {
   "machine_type": "W-300",
   "product": "W-300",
   "keywords": [
    "斷經率/萬米"
   ],
   "when": "2026",
   "layer": "vault",
   "content": "斷經率/萬米 12.5→3.2",
   "node_type": "Outcome",
   "metric": "斷經率/萬米",
   "id": "outcome-4561813e",
   "value": "12.5→3.2",
   "status": "success",
   "who": "bulk"
  },
  "defect-3929b635": {
   "machine_type": "W-450",
   "product": "W-450",
   "node_type": "Defect",
   "keywords": [
    "織造",
    "W-450",
    "稀密路"
   ],
   "id": "defect-3929b635",
   "when": "2026",
   "content": "W-450 稀密路（打緯力不穩定導致緯紗在布面上分佈不均）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-5324b210": {
   "machine_type": "W-450",
   "product": "W-450",
   "node_type": "Recipe",
   "keywords": [
    "織造",
    "W-450"
   ],
   "id": "recipe-5324b210",
   "params": "{\"打緯力\": \"4.5N → 8.0N\"}",
   "when": "2026",
   "content": "W-450 解法：嘗試大幅增加打緯力以強制將緯紗推至邊緣",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-72b1adb5": {
   "machine_type": "W-450",
   "product": "W-450",
   "keywords": [
    "稀密路發生率"
   ],
   "when": "2026",
   "layer": "vault",
   "content": "稀密路發生率 5%→8%",
   "node_type": "Outcome",
   "metric": "稀密路發生率",
   "id": "outcome-72b1adb5",
   "value": "5%→8%",
   "status": "failure",
   "who": "bulk"
  },
  "defect-b940c62e": {
   "machine_type": "JL-2",
   "product": "JL-2",
   "node_type": "Defect",
   "keywords": [
    "織造",
    "JL-2",
    "跳花"
   ],
   "id": "defect-b940c62e",
   "when": "2026",
   "content": "JL-2 跳花（開口時間不足，導致緯紗在經紗未完全分開前穿入，造成組織錯誤）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-5b50b0dc": {
   "machine_type": "JL-2",
   "product": "JL-2",
   "node_type": "Recipe",
   "keywords": [
    "織造",
    "JL-2"
   ],
   "id": "recipe-5b50b0dc",
   "params": "{\"開口時間\": \"12ms → 18ms\"}",
   "when": "2026",
   "content": "JL-2 解法：延長開口時間，確保織造口完全開啟",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-e20a4893": {
   "machine_type": "JL-2",
   "product": "JL-2",
   "keywords": [
    "跳花缺陷率"
   ],
   "when": "2026",
   "layer": "vault",
   "content": "跳花缺陷率 2.1%→0.3%",
   "node_type": "Outcome",
   "metric": "跳花缺陷率",
   "id": "outcome-e20a4893",
   "value": "2.1%→0.3%",
   "status": "success",
   "who": "bulk"
  },
  "defect-e3502db2": {
   "machine_type": "W-300",
   "product": "W-300",
   "node_type": "Defect",
   "keywords": [
    "織造",
    "W-300",
    "破洞"
   ],
   "id": "defect-e3502db2",
   "when": "2026",
   "content": "W-300 破洞（經紗張力過低導致開口不乾淨，緯紗打入時將經紗擊出）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-d88d5f85": {
   "machine_type": "W-300",
   "product": "W-300",
   "node_type": "Recipe",
   "keywords": [
    "織造",
    "W-300"
   ],
   "id": "recipe-d88d5f85",
   "params": "{\"經紗張力\": \"180g → 230g\"}",
   "when": "2026",
   "content": "W-300 解法：提高經紗張力以維持經紗挺直度",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-6945f612": {
   "machine_type": "W-300",
   "product": "W-300",
   "keywords": [
    "破洞數/百碼"
   ],
   "when": "2026",
   "layer": "vault",
   "content": "破洞數/百碼 4.0→0.5",
   "node_type": "Outcome",
   "metric": "破洞數/百碼",
   "id": "outcome-6945f612",
   "value": "4.0→0.5",
   "status": "success",
   "who": "bulk"
  },
  "defect-c8b2cdcb": {
   "machine_type": "W-450",
   "product": "W-450",
   "node_type": "Defect",
   "keywords": [
    "織造",
    "W-450",
    "斷緯"
   ],
   "id": "defect-c8b2cdcb",
   "when": "2026",
   "content": "W-450 斷緯（打緯力過大導致緯紗在穿梭過程中與經紗摩擦過劇而斷裂）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-13b01dbe": {
   "machine_type": "W-450",
   "product": "W-450",
   "node_type": "Recipe",
   "keywords": [
    "織造",
    "W-450"
   ],
   "id": "recipe-13b01dbe",
   "params": "{\"打緯力\": \"6.0N → 3.5N\", \"緯密\": \"40根/cm → 35根/cm\"}",
   "when": "2026",
   "content": "W-450 解法：降低打緯力並同步降低緯密以減少摩擦",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-93414164": {
   "machine_type": "W-450",
   "product": "W-450",
   "keywords": [
    "斷緯次數/小時"
   ],
   "when": "2026",
   "layer": "vault",
   "content": "斷緯次數/小時 8→12",
   "node_type": "Outcome",
   "metric": "斷緯次數/小時",
   "id": "outcome-93414164",
   "value": "8→12",
   "status": "failure",
   "who": "bulk"
  },
  "defect-15904883": {
   "machine_type": "JL-2",
   "product": "JL-2",
   "node_type": "Defect",
   "keywords": [
    "織造",
    "JL-2",
    "稀密路"
   ],
   "id": "defect-15904883",
   "when": "2026",
   "content": "JL-2 稀密路（緯密設定值與實際打緯力不匹配，導致緯紗回縮）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-5109e01f": {
   "machine_type": "JL-2",
   "product": "JL-2",
   "node_type": "Recipe",
   "keywords": [
    "織造",
    "JL-2"
   ],
   "id": "recipe-5109e01f",
   "params": "{\"打緯力\": \"4.2N → 4.8N\", \"緯密\": \"52根/cm → 54根/cm\"}",
   "when": "2026",
   "content": "JL-2 解法：微調打緯力並優化緯密參數，達到平衡",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-936e66da": {
   "machine_type": "JL-2",
   "product": "JL-2",
   "keywords": [
    "緯密標準差"
   ],
   "when": "2026",
   "layer": "vault",
   "content": "緯密標準差 0.85→0.21",
   "node_type": "Outcome",
   "metric": "緯密標準差",
   "id": "outcome-936e66da",
   "value": "0.85→0.21",
   "status": "success",
   "who": "bulk"
  },
  "defect-c31b2a13": {
   "machine_type": "G8.6",
   "product": "G8.6",
   "node_type": "Defect",
   "keywords": [
    "LCD",
    "G8.6",
    "雲狀Mura"
   ],
   "id": "defect-c31b2a13",
   "when": "2026",
   "content": "G8.6 雲狀Mura（ODF 滴量過高導致液滴在玻璃表面擴散不均，形成局部厚度差異。）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-d47114e5": {
   "machine_type": "G8.6",
   "product": "G8.6",
   "node_type": "Recipe",
   "keywords": [
    "LCD",
    "G8.6"
   ],
   "id": "recipe-d47114e5",
   "params": "{\"ODF 滴量(%)\": \"100% → 92%\"}",
   "when": "2026",
   "content": "G8.6 解法：降低 ODF 滴量以減少過量液滴堆積，優化表面張力。",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-1bb167b8": {
   "machine_type": "G8.6",
   "product": "G8.6",
   "keywords": [
    "Mura Contrast (ΔL)"
   ],
   "when": "2026",
   "content": "Mura Contrast (ΔL) 2.5→0.8",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "Mura Contrast (ΔL)",
   "id": "outcome-1bb167b8",
   "value": "2.5→0.8",
   "status": "success",
   "who": "bulk"
  },
  "defect-e67dc68d": {
   "machine_type": "G6",
   "product": "G6",
   "node_type": "Defect",
   "keywords": [
    "LCD",
    "G6",
    "亮度不均"
   ],
   "id": "defect-e67dc68d",
   "when": "2026",
   "content": "G6 亮度不均（配向膜烘烤溫度不足，導致膜層交聯度低，配向能力不穩定。）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-b2bed338": {
   "machine_type": "G6",
   "product": "G6",
   "node_type": "Recipe",
   "keywords": [
    "LCD",
    "G6"
   ],
   "id": "recipe-b2bed338",
   "params": "{\"配向膜烘烤溫度(°C)\": \"180 → 210\"}",
   "when": "2026",
   "content": "G6 解法：提高烘烤溫度以增加膜層硬度與配向穩定性。",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-d376330b": {
   "machine_type": "G6",
   "product": "G6",
   "keywords": [
    "Uniformity (%)"
   ],
   "when": "2026",
   "content": "Uniformity (%) 88%→94%",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "Uniformity (%)",
   "id": "outcome-d376330b",
   "value": "88%→94%",
   "status": "success",
   "who": "bulk"
  },
  "defect-0e15d290": {
   "machine_type": "G8.5",
   "product": "G8.5",
   "node_type": "Defect",
   "keywords": [
    "LCD",
    "G8.5",
    "重力Mura"
   ],
   "id": "defect-0e15d290",
   "when": "2026",
   "content": "G8.5 重力Mura（Cell gap 設定過大，導致液晶在重力作用下產生明顯的濃度梯度。）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-2d2a48e8": {
   "machine_type": "G8.5",
   "product": "G8.5",
   "node_type": "Recipe",
   "keywords": [
    "LCD",
    "G8.5"
   ],
   "id": "recipe-2d2a48e8",
   "params": "{\"ODF 滴量(%)\": \"100% → 120%\"}",
   "when": "2026",
   "content": "G8.5 解法：嘗試大幅增加 ODF 滴量以填補間隙（錯誤方向）。",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-c4099aa6": {
   "machine_type": "G8.5",
   "product": "G8.5",
   "keywords": [
    "Gravity Mura Level"
   ],
   "when": "2026",
   "content": "Gravity Mura Level High→Very High",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "Gravity Mura Level",
   "id": "outcome-c4099aa6",
   "value": "High→Very High",
   "status": "failure",
   "who": "bulk"
  },
  "defect-608ef4f3": {
   "machine_type": "G8.6",
   "product": "G8.6",
   "node_type": "Defect",
   "keywords": [
    "LCD",
    "G8.6",
    "線缺陷"
   ],
   "id": "defect-608ef4f3",
   "when": "2026",
   "content": "G8.6 線缺陷（配向角偏移導致液晶分子在邊界處產生扭曲應力，形成線狀亮紋。）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-908fb904": {
   "machine_type": "G8.6",
   "product": "G8.6",
   "node_type": "Recipe",
   "keywords": [
    "LCD",
    "G8.6"
   ],
   "id": "recipe-908fb904",
   "params": "{\"配向角\": \"0.5° → 0.2°\"}",
   "when": "2026",
   "content": "G8.6 解法：微調配向角以修正分子排列方向，消除應力集中。",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-000d6fb9": {
   "machine_type": "G8.6",
   "product": "G8.6",
   "keywords": [
    "Defect Count (per panel)"
   ],
   "when": "2026",
   "content": "Defect Count (per panel) 12→1",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "Defect Count (per panel)",
   "id": "outcome-000d6fb9",
   "value": "12→1",
   "status": "success",
   "who": "bulk"
  },
  "defect-fec25025": {
   "machine_type": "G6",
   "product": "G6",
   "node_type": "Defect",
   "keywords": [
    "LCD",
    "G6",
    "亮點Mura"
   ],
   "id": "defect-fec25025",
   "when": "2026",
   "content": "G6 亮點Mura（Cell gap 過小導致局部電場強度過高，液晶分子過度傾斜。）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-00b03777": {
   "machine_type": "G6",
   "product": "G6",
   "node_type": "Recipe",
   "keywords": [
    "LCD",
    "G6"
   ],
   "id": "recipe-00b03777",
   "params": "{\"配向膜烘烤溫度(°C)\": \"210 → 170\"}",
   "when": "2026",
   "content": "G6 解法：降低配向膜烘烤溫度以試圖改變表面能（錯誤方向）。",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-c5e933e4": {
   "machine_type": "G6",
   "product": "G6",
   "keywords": [
    "Bright Spot Diameter (μm)"
   ],
   "when": "2026",
   "content": "Bright Spot Diameter (μm) 50→80",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "Bright Spot Diameter (μm)",
   "id": "outcome-c5e933e4",
   "value": "50→80",
   "status": "failure",
   "who": "bulk"
  },
  "defect-7ef1d99c": {
   "machine_type": "G8.5",
   "product": "G8.5",
   "node_type": "Defect",
   "keywords": [
    "LCD",
    "G8.5",
    "亮度不均"
   ],
   "id": "defect-7ef1d99c",
   "when": "2026",
   "content": "G8.5 亮度不均（Cell gap 均勻度不佳，導致光透過率在面板中心與邊緣有顯著差異。）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-729062df": {
   "machine_type": "G8.5",
   "product": "G8.5",
   "node_type": "Recipe",
   "keywords": [
    "LCD",
    "G8.5"
   ],
   "id": "recipe-729062df",
   "params": "{\"cell gap\": \"3.5μm → 3.2μm\"}",
   "when": "2026",
   "content": "G8.5 解法：精確調整 Cell gap 數值，優化玻璃基板平行度。",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-7b7227f5": {
   "machine_type": "G8.5",
   "product": "G8.5",
   "keywords": [
    "Luminance Variation (%)"
   ],
   "when": "2026",
   "content": "Luminance Variation (%) 7.2%→3.1%",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "Luminance Variation (%)",
   "id": "outcome-7b7227f5",
   "value": "7.2%→3.1%",
   "status": "success",
   "who": "bulk"
  },
  "defect-d00bb63c": {
   "machine_type": "Etcher-ICP",
   "product": "Etcher-ICP",
   "node_type": "Defect",
   "keywords": [
    "半導體",
    "Etcher-ICP",
    "蝕刻不足"
   ],
   "id": "defect-d00bb63c",
   "when": "2026",
   "content": "Etcher-ICP 蝕刻不足（腔壓過高導致離子方向性不足，底層殘留物過多）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-c4aea998": {
   "machine_type": "Etcher-ICP",
   "product": "Etcher-ICP",
   "node_type": "Recipe",
   "keywords": [
    "半導體",
    "Etcher-ICP"
   ],
   "id": "recipe-c4aea998",
   "params": "{\"腔壓\": \"5 mTorr\", \"RF功率\": \"800 W\"}",
   "when": "2026",
   "content": "Etcher-ICP 解法：降低腔壓以增加離子平均自由路徑，提升垂直蝕刻率",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-7a65ce5a": {
   "machine_type": "Etcher-ICP",
   "product": "Etcher-ICP",
   "keywords": [
    "Residual Thickness (nm)"
   ],
   "when": "2026",
   "content": "Residual Thickness (nm) 15→2",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "Residual Thickness (nm)",
   "id": "outcome-7a65ce5a",
   "value": "15→2",
   "status": "success",
   "who": "bulk"
  },
  "defect-26400299": {
   "machine_type": "PECVD-A",
   "product": "PECVD-A",
   "node_type": "Defect",
   "keywords": [
    "半導體",
    "PECVD-A",
    "薄膜厚度不均"
   ],
   "id": "defect-26400299",
   "when": "2026",
   "content": "PECVD-A 薄膜厚度不均（加熱盤溫度分佈不均導致成膜速率差異）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-32748c7e": {
   "machine_type": "PECVD-A",
   "product": "PECVD-A",
   "node_type": "Recipe",
   "keywords": [
    "半導體",
    "PECVD-A"
   ],
   "id": "recipe-32748c7e",
   "params": "{\"溫度\": \"420 °C\", \"氣體流量\": \"250 sccm\"}",
   "when": "2026",
   "content": "PECVD-A 解法：提高基板溫度以增加表面遷移率，並微調氣體流量",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-2d484360": {
   "machine_type": "PECVD-A",
   "product": "PECVD-A",
   "keywords": [
    "Uniformity (%)"
   ],
   "when": "2026",
   "layer": "vault",
   "content": "Uniformity (%) 4.2→1.8",
   "node_type": "Outcome",
   "metric": "Uniformity (%)",
   "id": "outcome-2d484360",
   "value": "4.2→1.8",
   "status": "success",
   "who": "bulk"
  },
  "defect-03e9da27": {
   "machine_type": "CMP-1",
   "product": "CMP-1",
   "node_type": "Defect",
   "keywords": [
    "半導體",
    "CMP-1",
    "刮傷"
   ],
   "id": "defect-03e9da27",
   "when": "2026",
   "content": "CMP-1 刮傷（研磨壓力過高導致局部應力集中，產生微刮傷）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-1b9e7cd5": {
   "machine_type": "CMP-1",
   "product": "CMP-1",
   "node_type": "Recipe",
   "keywords": [
    "半導體",
    "CMP-1"
   ],
   "id": "recipe-1b9e7cd5",
   "params": "{\"研磨壓力\": \"12 psi\", \"轉速\": \"120 rpm\"}",
   "when": "2026",
   "content": "CMP-1 解法：嘗試大幅增加轉速以維持去除率，但維持高壓力",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-6602bd0c": {
   "machine_type": "CMP-1",
   "product": "CMP-1",
   "keywords": [
    "Scratch Count (per wafer)"
   ],
   "when": "2026",
   "content": "Scratch Count (per wafer) 12→25",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "Scratch Count (per wafer)",
   "id": "outcome-6602bd0c",
   "value": "12→25",
   "status": "failure",
   "who": "bulk"
  },
  "defect-cfa3f3b0": {
   "machine_type": "Litho-i",
   "product": "Litho-i",
   "node_type": "Defect",
   "keywords": [
    "半導體",
    "Litho-i",
    "CD偏移"
   ],
   "id": "defect-cfa3f3b0",
   "when": "2026",
   "content": "Litho-i CD偏移（曝光劑量不足導致光阻未完全反應，線寬偏大）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-b6ee10c1": {
   "machine_type": "Litho-i",
   "product": "Litho-i",
   "node_type": "Recipe",
   "keywords": [
    "半導體",
    "Litho-i"
   ],
   "id": "recipe-b6ee10c1",
   "params": "{\"曝光劑量\": \"28 mJ/cm²\"}",
   "when": "2026",
   "content": "Litho-i 解法：增加曝光劑量以縮小臨界尺寸 (CD)",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-0cabc03e": {
   "machine_type": "Litho-i",
   "product": "Litho-i",
   "keywords": [
    "CD (nm)"
   ],
   "when": "2026",
   "content": "CD (nm) 112→105",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "CD (nm)",
   "id": "outcome-0cabc03e",
   "value": "112→105",
   "status": "success",
   "who": "bulk"
  },
  "defect-257c819b": {
   "machine_type": "Etcher-ICP",
   "product": "Etcher-ICP",
   "node_type": "Defect",
   "keywords": [
    "半導體",
    "Etcher-ICP",
    "CD偏移"
   ],
   "id": "defect-257c819b",
   "when": "2026",
   "content": "Etcher-ICP CD偏移（RF功率過高導致側壁過蝕 (Over-etch)）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-ba9905e8": {
   "machine_type": "Etcher-ICP",
   "product": "Etcher-ICP",
   "node_type": "Recipe",
   "keywords": [
    "半導體",
    "Etcher-ICP"
   ],
   "id": "recipe-ba9905e8",
   "params": "{\"RF功率\": \"200 W\", \"腔壓\": \"10 mTorr\"}",
   "when": "2026",
   "content": "Etcher-ICP 解法：大幅降低RF功率以減少離子撞擊能量",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-9cb56e17": {
   "machine_type": "Etcher-ICP",
   "product": "Etcher-ICP",
   "keywords": [
    "CD (nm)"
   ],
   "when": "2026",
   "content": "CD (nm) 90→120",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "CD (nm)",
   "id": "outcome-9cb56e17",
   "value": "90→120",
   "status": "failure",
   "who": "bulk"
  },
  "defect-9764e6bb": {
   "machine_type": "CMP-1",
   "product": "CMP-1",
   "node_type": "Defect",
   "keywords": [
    "半導體",
    "CMP-1",
    "particle"
   ],
   "id": "defect-9764e6bb",
   "when": "2026",
   "content": "CMP-1 particle（研磨墊盤磨損導致微小碎片污染）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-acbe6bb4": {
   "machine_type": "CMP-1",
   "product": "CMP-1",
   "node_type": "Recipe",
   "keywords": [
    "半導體",
    "CMP-1"
   ],
   "id": "recipe-acbe6bb4",
   "params": "{\"研磨壓力\": \"6 psi\", \"轉速\": \"60 rpm\"}",
   "when": "2026",
   "content": "CMP-1 解法：降低研磨壓力並適度調低轉速，減少機械摩擦",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-1bf98ad0": {
   "machine_type": "CMP-1",
   "product": "CMP-1",
   "keywords": [
    "Particle Count (>0.1um)"
   ],
   "when": "2026",
   "content": "Particle Count (>0.1um) 450→80",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "Particle Count (>0.1um)",
   "id": "outcome-1bf98ad0",
   "value": "450→80",
   "status": "success",
   "who": "bulk"
  },
  "defect-102020e5": {
   "machine_type": "AHU-01",
   "product": "AHU-01",
   "node_type": "Defect",
   "keywords": [
    "風機",
    "AHU-01",
    "風量不足"
   ],
   "id": "defect-102020e5",
   "when": "2026",
   "content": "AHU-01 風量不足（變頻器設定頻率過低，無法克服系統靜壓）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-66d09892": {
   "machine_type": "AHU-01",
   "product": "AHU-01",
   "node_type": "Recipe",
   "keywords": [
    "風機",
    "AHU-01"
   ],
   "id": "recipe-66d09892",
   "params": "{\"變頻\": \"42Hz\", \"轉速\": \"1260rpm\"}",
   "when": "2026",
   "content": "AHU-01 解法：調高變頻頻率以增加風機轉速，提升出風量",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-022d18b7": {
   "machine_type": "AHU-01",
   "product": "AHU-01",
   "keywords": [
    "風量(CMM)"
   ],
   "when": "2026",
   "layer": "vault",
   "content": "風量(CMM) 18.5→22.0",
   "node_type": "Outcome",
   "metric": "風量(CMM)",
   "id": "outcome-022d18b7",
   "value": "18.5→22.0",
   "status": "success",
   "who": "bulk"
  },
  "defect-01b2a4ed": {
   "machine_type": "CF-200",
   "product": "CF-200",
   "node_type": "Defect",
   "keywords": [
    "風機",
    "CF-200",
    "振動過大"
   ],
   "id": "defect-01b2a4ed",
   "when": "2026",
   "content": "CF-200 振動過大（運作轉速接近設備共振頻率點）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-b5b0275f": {
   "machine_type": "CF-200",
   "product": "CF-200",
   "node_type": "Recipe",
   "keywords": [
    "風機",
    "CF-200"
   ],
   "id": "recipe-b5b0275f",
   "params": "{\"轉速\": \"2100rpm\", \"變頻\": \"63Hz\"}",
   "when": "2026",
   "content": "CF-200 解法：嘗試將轉速調高以跳脫共振區間",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-dcaeb24a": {
   "machine_type": "CF-200",
   "product": "CF-200",
   "keywords": [
    "振動速度(mm/s)"
   ],
   "when": "2026",
   "content": "振動速度(mm/s) 7.2→8.5",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "振動速度(mm/s)",
   "id": "outcome-dcaeb24a",
   "value": "7.2→8.5",
   "status": "failure",
   "who": "bulk"
  },
  "defect-3df52a65": {
   "machine_type": "AF-50",
   "product": "AF-50",
   "node_type": "Defect",
   "keywords": [
    "風機",
    "AF-50",
    "能耗偏高"
   ],
   "id": "defect-3df52a65",
   "when": "2026",
   "content": "AF-50 能耗偏高（葉片角度過大導致風阻增加，馬達負荷過重）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-c1a55edc": {
   "machine_type": "AF-50",
   "product": "AF-50",
   "node_type": "Recipe",
   "keywords": [
    "風機",
    "AF-50"
   ],
   "id": "recipe-c1a55edc",
   "params": "{\"葉片角\": \"12deg\", \"風壓\": \"350Pa\"}",
   "when": "2026",
   "content": "AF-50 解法：優化葉片角度，在滿足風壓前提下降低功耗",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-840b0ac2": {
   "machine_type": "AF-50",
   "product": "AF-50",
   "keywords": [
    "電流(A)"
   ],
   "when": "2026",
   "layer": "vault",
   "content": "電流(A) 15.8→12.4",
   "node_type": "Outcome",
   "metric": "電流(A)",
   "id": "outcome-840b0ac2",
   "value": "15.8→12.4",
   "status": "success",
   "who": "bulk"
  },
  "defect-8f1d7e24": {
   "machine_type": "AHU-01",
   "product": "AHU-01",
   "node_type": "Defect",
   "keywords": [
    "風機",
    "AHU-01",
    "壓差不穩"
   ],
   "id": "defect-8f1d7e24",
   "when": "2026",
   "content": "AHU-01 壓差不穩（風量設定過高導致入口端產生喘振現象）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-cfeb428d": {
   "machine_type": "AHU-01",
   "product": "AHU-01",
   "node_type": "Recipe",
   "keywords": [
    "風機",
    "AHU-01"
   ],
   "id": "recipe-cfeb428d",
   "params": "{\"轉速\": \"1500rpm\", \"變頻\": \"50Hz\"}",
   "when": "2026",
   "content": "AHU-01 解法：強行增加轉速以試圖強行壓制壓力波動",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-63f21a12": {
   "machine_type": "AHU-01",
   "product": "AHU-01",
   "keywords": [
    "壓差波動(Pa)"
   ],
   "when": "2026",
   "content": "壓差波動(Pa) ±40→±110",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "壓差波動(Pa)",
   "id": "outcome-63f21a12",
   "value": "±40→±110",
   "status": "failure",
   "who": "bulk"
  },
  "defect-77d85849": {
   "machine_type": "CF-200",
   "product": "CF-200",
   "node_type": "Defect",
   "keywords": [
    "風機",
    "CF-200",
    "異音"
   ],
   "id": "defect-77d85849",
   "when": "2026",
   "content": "CF-200 異音（風量過低導致葉片與外殼產生氣流脫離渦流）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-f5804f98": {
   "machine_type": "CF-200",
   "product": "CF-200",
   "node_type": "Recipe",
   "keywords": [
    "風機",
    "CF-200"
   ],
   "id": "recipe-f5804f98",
   "params": "{\"變頻\": \"35Hz\", \"風量\": \"12.0CMM\"}",
   "when": "2026",
   "content": "CF-200 解法：適度調高變頻頻率，使氣流趨於穩定",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-e2775c0d": {
   "machine_type": "CF-200",
   "product": "CF-200",
   "keywords": [
    "噪音等級(dB)"
   ],
   "when": "2026",
   "layer": "vault",
   "content": "噪音等級(dB) 88→76",
   "node_type": "Outcome",
   "metric": "噪音等級(dB)",
   "id": "outcome-e2775c0d",
   "value": "88→76",
   "status": "success",
   "who": "bulk"
  },
  "defect-854c80bd": {
   "machine_type": "AF-50",
   "product": "AF-50",
   "node_type": "Defect",
   "keywords": [
    "風機",
    "AF-50",
    "風量不足"
   ],
   "id": "defect-854c80bd",
   "when": "2026",
   "content": "AF-50 風量不足（葉片角度設定過小，單次掃風量不足）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-57dffeb0": {
   "machine_type": "AF-50",
   "product": "AF-50",
   "node_type": "Recipe",
   "keywords": [
    "風機",
    "AF-50"
   ],
   "id": "recipe-57dffeb0",
   "params": "{\"葉片角\": \"25deg\", \"風量\": \"15.0CMM\"}",
   "when": "2026",
   "content": "AF-50 解法：將葉片角度調至最大極限，不考慮能耗",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-4be4d746": {
   "machine_type": "AF-50",
   "product": "AF-50",
   "keywords": [
    "振動速度(mm/s)"
   ],
   "when": "2026",
   "content": "振動速度(mm/s) 2.1→6.8",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "振動速度(mm/s)",
   "id": "outcome-4be4d746",
   "value": "2.1→6.8",
   "status": "failure",
   "who": "bulk"
  },
  "defect-9a457028": {
   "machine_type": "Chiller-A",
   "product": "Chiller-A",
   "node_type": "Defect",
   "keywords": [
    "水機",
    "Chiller-A",
    "出水溫震盪"
   ],
   "id": "defect-9a457028",
   "when": "2026",
   "content": "Chiller-A 出水溫震盪（PID 比例增益(P)過高，導致系統在設定點附近產生過衝與持續震盪。）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-88dc85c6": {
   "machine_type": "Chiller-A",
   "product": "Chiller-A",
   "node_type": "Recipe",
   "keywords": [
    "水機",
    "Chiller-A"
   ],
   "id": "recipe-88dc85c6",
   "params": "{\"PID增益\": 0.8, \"出水溫(°C)\": 7.0}",
   "when": "2026",
   "content": "Chiller-A 解法：降低 PID 增益以增加系統穩定度，並適度增加積分時間。",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-2f0e23aa": {
   "machine_type": "Chiller-A",
   "product": "Chiller-A",
   "keywords": [
    "溫度波動幅度(±°C)"
   ],
   "when": "2026",
   "content": "溫度波動幅度(±°C) ±1.2→±0.2",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "溫度波動幅度(±°C)",
   "id": "outcome-2f0e23aa",
   "value": "±1.2→±0.2",
   "status": "success",
   "who": "bulk"
  },
  "defect-3fe485ec": {
   "machine_type": "Pump-3",
   "product": "Pump-3",
   "node_type": "Defect",
   "keywords": [
    "水機",
    "Pump-3",
    "流量不足"
   ],
   "id": "defect-3fe485ec",
   "when": "2026",
   "content": "Pump-3 流量不足（泵浦頻率設定過低，無法克服管路壓損。）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-bbe95a77": {
   "machine_type": "Pump-3",
   "product": "Pump-3",
   "node_type": "Recipe",
   "keywords": [
    "水機",
    "Pump-3"
   ],
   "id": "recipe-bbe95a77",
   "params": "{\"泵頻(Hz)\": 55, \"流量(LPM)\": 120}",
   "when": "2026",
   "content": "Pump-3 解法：調高泵浦運行頻率以增加揚程與流量。",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-9d0fe05a": {
   "machine_type": "Pump-3",
   "product": "Pump-3",
   "keywords": [
    "實際流量(LPM)"
   ],
   "when": "2026",
   "layer": "vault",
   "content": "實際流量(LPM) 85→118",
   "node_type": "Outcome",
   "metric": "實際流量(LPM)",
   "id": "outcome-9d0fe05a",
   "value": "85→118",
   "status": "success",
   "who": "bulk"
  },
  "defect-d1970149": {
   "machine_type": "Chiller-A",
   "product": "Chiller-A",
   "node_type": "Defect",
   "keywords": [
    "水機",
    "Chiller-A",
    "結霜"
   ],
   "id": "defect-d1970149",
   "when": "2026",
   "content": "Chiller-A 結霜（過熱度設定過低，導致蒸發器內壁溫度低於冰點且冷媒液滴回流。）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-6be47ea4": {
   "machine_type": "Chiller-A",
   "product": "Chiller-A",
   "node_type": "Recipe",
   "keywords": [
    "水機",
    "Chiller-A"
   ],
   "id": "recipe-6be47ea4",
   "params": "{\"壓縮機載度(%)\": 40, \"過熱度(K)\": 2}",
   "when": "2026",
   "content": "Chiller-A 解法：嘗試降低壓縮機載度以減少製冷量（錯誤方向，未解決過熱度問題）。",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-7be6ca81": {
   "machine_type": "Chiller-A",
   "product": "Chiller-A",
   "keywords": [
    "蒸發器表面溫度(°C)"
   ],
   "when": "2026",
   "content": "蒸發器表面溫度(°C) -2.0→-1.5",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "蒸發器表面溫度(°C)",
   "id": "outcome-7be6ca81",
   "value": "-2.0→-1.5",
   "status": "failure",
   "who": "bulk"
  },
  "defect-6eaa71bd": {
   "machine_type": "Tower-2",
   "product": "Tower-2",
   "node_type": "Defect",
   "keywords": [
    "水機",
    "Tower-2",
    "COP下降"
   ],
   "id": "defect-6eaa71bd",
   "when": "2026",
   "content": "Tower-2 COP下降（冷凝端散熱不良，導致壓縮機功耗增加。）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-530fe1a3": {
   "machine_type": "Tower-2",
   "product": "Tower-2",
   "node_type": "Recipe",
   "keywords": [
    "水機",
    "Tower-2"
   ],
   "id": "recipe-530fe1a3",
   "params": "{\"流量(LPM)\": 250, \"泵頻(Hz)\": 60}",
   "when": "2026",
   "content": "Tower-2 解法：增加循環水流量以提升熱交換效率，降低冷凝壓力。",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-d8ea4c00": {
   "machine_type": "Tower-2",
   "product": "Tower-2",
   "keywords": [
    "COP"
   ],
   "when": "2026",
   "content": "COP 3.2→3.8",
   "layer": "vault",
   "node_type": "Outcome",
   "metric": "COP",
   "id": "outcome-d8ea4c00",
   "value": "3.2→3.8",
   "status": "success",
   "who": "bulk"
  },
  "defect-a50e4dbb": {
   "machine_type": "Chiller-A",
   "product": "Chiller-A",
   "node_type": "Defect",
   "keywords": [
    "水機",
    "Chiller-A",
    "高壓跳機"
   ],
   "id": "defect-a50e4dbb",
   "when": "2026",
   "content": "Chiller-A 高壓跳機（冷凝壓力過高，嘗試透過強行調低出水溫來降低壓力（邏輯錯誤）。）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-2c055690": {
   "machine_type": "Chiller-A",
   "product": "Chiller-A",
   "node_type": "Recipe",
   "keywords": [
    "水機",
    "Chiller-A"
   ],
   "id": "recipe-2c055690",
   "params": "{\"出水溫(°C)\": 5.0, \"壓縮機載度(%)\": 80}",
   "when": "2026",
   "content": "Chiller-A 解法：將出水溫設定調低，試圖以降低負荷來緩解高壓跳機。",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-fcfbe1c0": {
   "machine_type": "Chiller-A",
   "product": "Chiller-A",
   "keywords": [
    "高壓壓力(MPa)"
   ],
   "when": "2026",
   "layer": "vault",
   "content": "高壓壓力(MPa) 2.8→3.1",
   "node_type": "Outcome",
   "metric": "高壓壓力(MPa)",
   "id": "outcome-fcfbe1c0",
   "value": "2.8→3.1",
   "status": "failure",
   "who": "bulk"
  },
  "defect-683ca46d": {
   "machine_type": "Pump-3",
   "product": "Pump-3",
   "node_type": "Defect",
   "keywords": [
    "水機",
    "Pump-3",
    "流量不足"
   ],
   "id": "defect-683ca46d",
   "when": "2026",
   "content": "Pump-3 流量不足（泵浦頻率不足以應對高黏度流體或長管路。）",
   "layer": "vault",
   "who": "bulk"
  },
  "recipe-0a161fda": {
   "machine_type": "Pump-3",
   "product": "Pump-3",
   "node_type": "Recipe",
   "keywords": [
    "水機",
    "Pump-3"
   ],
   "id": "recipe-0a161fda",
   "params": "{\"泵頻(Hz)\": 60, \"流量(LPM)\": 150}",
   "when": "2026",
   "content": "Pump-3 解法：將泵頻提升至額定上限，並確認流量是否達到目標值。",
   "layer": "vault",
   "who": "bulk"
  },
  "outcome-aef56261": {
   "machine_type": "Pump-3",
   "product": "Pump-3",
   "keywords": [
    "實際流量(LPM)"
   ],
   "when": "2026",
   "layer": "vault",
   "content": "實際流量(LPM) 90→145",
   "node_type": "Outcome",
   "metric": "實際流量(LPM)",
   "id": "outcome-aef56261",
   "value": "90→145",
   "status": "success",
   "who": "bulk"
  },
  "insight-3e9bf5a3": {
   "node_type": "Insight",
   "keywords": [
    "EL-180",
    "NX-220",
    "張力不均",
    "張力標準差",
    "整經",
    "斷紗",
    "斷紗率"
   ],
   "scope": "高速捲繞製程之張力控制與斷紗防治",
   "id": "insight-3e9bf5a3",
   "content": "針對紗線張力異常，應優先排除物理磨損（如導輪）並優化張力參數與車速之匹配，忌僅透過增加上漿濃度等化學補償來掩蓋機械失效。",
   "layer": "vault"
  },
  "insight-9aa3926c": {
   "node_type": "Insight",
   "keywords": [
    "CT-100",
    "EL-200",
    "NX-220",
    "SP-90",
    "捲繞不良",
    "整經",
    "斷紗",
    "斷紗次數/1000m",
    "毛羽過多",
    "毛羽長度(mm)",
    "筒紗密度(g/cm3)",
    "跳紗",
    "跳紗發生率"
   ],
   "scope": "高速捲繞與導紗製程（適用於棉紗、絲紗、彈性紗等不同材質）",
   "id": "insight-9aa3926c",
   "content": "針對紗線表面缺陷，應優先透過「優化上漿配方/噴塗量」與「精準控制張力」來降低摩擦與靜電，忌以盲目提高車速作為解決方案，以免造成密度下降或品質惡化。",
   "layer": "vault"
  },
  "insight-6ad59bba": {
   "node_type": "Insight",
   "keywords": [
    "W-300",
    "W-450",
    "斷經",
    "斷經率/萬米",
    "稀密路",
    "稀密路發生率",
    "織造"
   ],
   "scope": "織造機(W-300/W-450)張力控制與缺陷優化",
   "id": "insight-6ad59bba",
   "content": "針對經緯紗張力調整，應採取「經紗適度放鬆以增加延展性，緯紗保持穩定而非盲目增加壓力」的策略；宜調低經紗張力以降低斷經率，忌大幅增加打緯力以免加劇稀密路缺陷。",
   "layer": "vault"
  },
  "insight-a0962ec2": {
   "node_type": "Insight",
   "keywords": [
    "JL-2",
    "W-300",
    "W-450",
    "斷緯",
    "斷緯次數/小時",
    "破洞",
    "破洞數/百碼",
    "稀密路",
    "緯密標準差",
    "織造",
    "跳花",
    "跳花缺陷率"
   ],
   "scope": "織造機（JL-2, W-300, W-450）之組織缺陷與張力控制",
   "id": "insight-a0962ec2",
   "content": "優化織造品質需建立「開口-張力-打緯力」的平衡機制：確保開口時間充足且經紗張力適中以防止跳花與破洞，同時嚴禁打緯力過大，應透過微調打緯力與緯密參數的匹配度來消除稀密路並避免斷緯。",
   "layer": "vault"
  },
  "insight-58dee191": {
   "node_type": "Insight",
   "keywords": [
    "G6",
    "G8.6",
    "LCD",
    "Mura Contrast (ΔL)",
    "Uniformity (%)",
    "亮度不均",
    "雲狀Mura"
   ],
   "scope": "G6/G8.6 玻璃基板薄膜塗佈與烘烤製程",
   "id": "insight-58dee191",
   "content": "優化薄膜成膜品質時，應嚴格控制液滴滴量以防擴散不均（忌過量），並確保烘烤溫度足以達成所需交聯度（宜提高），以消除局部厚度差異與配向不穩定導致的 Mura 或亮度不均。",
   "layer": "vault"
  },
  "insight-645cba55": {
   "node_type": "Insight",
   "keywords": [
    "Bright Spot Diameter (μm)",
    "Defect Count (per panel)",
    "G6",
    "G8.5",
    "G8.6",
    "Gravity Mura Level",
    "LCD",
    "Luminance Variation (%)",
    "亮度不均",
    "亮點Mura",
    "線缺陷",
    "重力Mura"
   ],
   "scope": "液晶面板 (LCD) Cell gap 均勻度與配向控制製程",
   "id": "insight-645cba55",
   "content": "針對 Mura 或亮度不均缺陷，應優先精確校準 Cell gap 數值與基板平行度以控制液晶層厚度，忌以增加 ODF 滴量或調整烘烤溫度等非對稱手段掩蓋結構性間隙問題。",
   "layer": "vault"
  },
  "insight-b52afee4": {
   "node_type": "Insight",
   "keywords": [
    "CD (nm)",
    "CD偏移",
    "CMP-1",
    "Etcher-ICP",
    "Litho-i",
    "PECVD-A",
    "Residual Thickness (nm)",
    "Scratch Count (per wafer)",
    "Uniformity (%)",
    "刮傷",
    "半導體",
    "薄膜厚度不均",
    "蝕刻不足"
   ],
   "scope": "",
   "id": "insight-b52afee4",
   "content": "(LLM 無法歸納)",
   "layer": "vault"
  },
  "insight-ab431452": {
   "node_type": "Insight",
   "keywords": [
    "CD (nm)",
    "CD偏移",
    "CMP-1",
    "Etcher-ICP",
    "Particle Count (>0.1um)",
    "particle",
    "半導體"
   ],
   "scope": "Etcher-ICP CD控制、CMP Particle抑制",
   "id": "insight-ab431452",
   "content": "針對物理性損傷導致的缺陷（如側壁過蝕或碎片污染），應採取「降低能量輸入（RF功率/研磨壓力/轉速）」的策略以減少離子撞擊或機械摩擦，避免過度加工。",
   "layer": "vault"
  },
  "insight-d391d5c3": {
   "node_type": "Insight",
   "keywords": [
    "AF-50",
    "AHU-01",
    "CF-200",
    "壓差不穩",
    "壓差波動(Pa)",
    "振動速度(mm/s)",
    "振動過大",
    "能耗偏高",
    "電流(A)",
    "風機",
    "風量(CMM)",
    "風量不足"
   ],
   "scope": "空調系統(AHU/CF/AF)風機參數調優",
   "id": "insight-d391d5c3",
   "content": "調整風機轉速與葉片角度以優化風量與能效時，應優先確認設備共振頻率與喘振臨界點；宜採取「小幅調整、驗證數據」之方式，忌在共振區間或喘振狀態下強行增加轉速。",
   "layer": "vault"
  },
  "insight-2f431994": {
   "node_type": "Insight",
   "keywords": [
    "AF-50",
    "CF-200",
    "噪音等級(dB)",
    "振動速度(mm/s)",
    "異音",
    "風機",
    "風量不足"
   ],
   "scope": "風機類設備(CF/AF系列)氣流穩定性與噪音優化",
   "id": "insight-2f431994",
   "content": "針對風機異音或風量不足，應優先調高變頻頻率或葉片角度以穩定氣流，但須嚴格監控振動速度，避免追求風量而導致振動超標。",
   "layer": "vault"
  },
  "insight-4037ccf2": {
   "node_type": "Insight",
   "keywords": [
    "COP",
    "COP下降",
    "Chiller-A",
    "Pump-3",
    "Tower-2",
    "出水溫震盪",
    "實際流量(LPM)",
    "水機",
    "流量不足",
    "溫度波動幅度(±°C)",
    "結霜",
    "蒸發器表面溫度(°C)"
   ],
   "scope": "冷卻水機(Chiller)、冷卻塔(Tower)及泵浦(Pump)之製程參數調優",
   "id": "insight-4037ccf2",
   "content": "優化冷卻系統效能時，應優先針對「能量交換效率」與「控制參數」進行調整：提升循環流量以降低冷凝壓力、調低PID比例增益以消除溫度震盪；忌以降低壓縮機載度來處理結霜，應正確設定過熱度以防止冷媒回流。",
   "layer": "vault"
  },
  "insight-ddaf243c": {
   "node_type": "Insight",
   "keywords": [
    "Chiller-A",
    "Pump-3",
    "實際流量(LPM)",
    "水機",
    "流量不足",
    "高壓壓力(MPa)",
    "高壓跳機"
   ],
   "scope": "冷卻系統(Chiller)壓力控制與流體輸送(Pump)流量調優",
   "id": "insight-ddaf243c",
   "content": "針對設備壓力或流量異常，應採取「正向物理補償（如提升泵浦頻率）」而非「反向邏輯調節（如調低冷卻水溫以降低壓力）」，避免因誤判物理機制導致壓力反向飆升。",
   "layer": "vault"
  },
  "defect-c428a3f7": {
   "machine_type": "AI4I",
   "product": "AI4I-機台",
   "node_type": "Defect",
   "keywords": [
    "AI4I",
    "失效",
    "TWF",
    "刀具磨損失效"
   ],
   "id": "defect-c428a3f7",
   "source": "AI4I 2020 Predictive Maintenance (UCI)",
   "when": "UCI dataset 601",
   "layer": "vault",
   "content": "刀具磨損失效 (Tool Wear Failure)：刀具磨損達 200–240 分鐘後隨機失效（觀測 tool_wear_min：198–253）",
   "who": "AI4I-2020"
  },
  "recipe-07a61938": {
   "machine_type": "AI4I",
   "product": "AI4I-機台",
   "node_type": "Recipe",
   "keywords": [
    "AI4I",
    "TWF",
    "對策"
   ],
   "id": "recipe-07a61938",
   "source": "AI4I 2020 Predictive Maintenance (UCI)",
   "when": "UCI dataset 601",
   "layer": "vault",
   "content": "TWF 對策：預防性換刀：在磨損達 ~200 min 前更換刀具",
   "who": "AI4I-2020"
  },
  "outcome-2b5dcc7d": {
   "machine_type": "AI4I",
   "product": "AI4I-機台",
   "keywords": [
    "AI4I",
    "TWF"
   ],
   "source": "AI4I 2020 Predictive Maintenance (UCI)",
   "when": "UCI dataset 601",
   "layer": "vault",
   "content": "TWF 於資料集出現 46 次（0.46%）",
   "node_type": "Outcome",
   "metric": "TWF_count",
   "id": "outcome-2b5dcc7d",
   "value": "46",
   "status": "failure",
   "who": "AI4I-2020"
  },
  "defect-28ad9240": {
   "machine_type": "AI4I",
   "product": "AI4I-機台",
   "node_type": "Defect",
   "keywords": [
    "AI4I",
    "失效",
    "HDF",
    "散熱失效"
   ],
   "id": "defect-28ad9240",
   "source": "AI4I 2020 Predictive Maintenance (UCI)",
   "when": "UCI dataset 601",
   "layer": "vault",
   "content": "散熱失效 (Heat Dissipation Failure)：氣溫與製程溫差 < 8.6K 且轉速 < 1380 rpm（觀測 rot_speed：1212–1379）",
   "who": "AI4I-2020"
  },
  "recipe-831e7556": {
   "machine_type": "AI4I",
   "product": "AI4I-機台",
   "node_type": "Recipe",
   "keywords": [
    "AI4I",
    "HDF",
    "對策"
   ],
   "id": "recipe-831e7556",
   "source": "AI4I 2020 Predictive Maintenance (UCI)",
   "when": "UCI dataset 601",
   "layer": "vault",
   "content": "HDF 對策：改善散熱或提高轉速，使溫差>8.6K、轉速>1380rpm",
   "who": "AI4I-2020"
  },
  "outcome-e33c065e": {
   "machine_type": "AI4I",
   "product": "AI4I-機台",
   "keywords": [
    "AI4I",
    "HDF"
   ],
   "source": "AI4I 2020 Predictive Maintenance (UCI)",
   "when": "UCI dataset 601",
   "layer": "vault",
   "content": "HDF 於資料集出現 115 次（1.15%）",
   "node_type": "Outcome",
   "metric": "HDF_count",
   "id": "outcome-e33c065e",
   "value": "115",
   "status": "failure",
   "who": "AI4I-2020"
  },
  "defect-fb954158": {
   "machine_type": "AI4I",
   "product": "AI4I-機台",
   "node_type": "Defect",
   "keywords": [
    "AI4I",
    "失效",
    "PWF",
    "功率失效"
   ],
   "id": "defect-fb954158",
   "source": "AI4I 2020 Predictive Maintenance (UCI)",
   "when": "UCI dataset 601",
   "layer": "vault",
   "content": "功率失效 (Power Failure)：功率(扭矩×角速度)落在 3500–9000W 區間外（觀測 power_W：1148–10470）",
   "who": "AI4I-2020"
  },
  "recipe-2ac0293e": {
   "machine_type": "AI4I",
   "product": "AI4I-機台",
   "node_type": "Recipe",
   "keywords": [
    "AI4I",
    "PWF",
    "對策"
   ],
   "id": "recipe-2ac0293e",
   "source": "AI4I 2020 Predictive Maintenance (UCI)",
   "when": "UCI dataset 601",
   "layer": "vault",
   "content": "PWF 對策：調整扭矩/轉速使功率回到 3500–9000W",
   "who": "AI4I-2020"
  },
  "outcome-73502436": {
   "machine_type": "AI4I",
   "product": "AI4I-機台",
   "keywords": [
    "AI4I",
    "PWF"
   ],
   "source": "AI4I 2020 Predictive Maintenance (UCI)",
   "when": "UCI dataset 601",
   "layer": "vault",
   "content": "PWF 於資料集出現 95 次（0.95%）",
   "node_type": "Outcome",
   "metric": "PWF_count",
   "id": "outcome-73502436",
   "value": "95",
   "status": "failure",
   "who": "AI4I-2020"
  },
  "defect-77d7e872": {
   "machine_type": "AI4I",
   "product": "AI4I-機台",
   "node_type": "Defect",
   "keywords": [
    "AI4I",
    "失效",
    "OSF",
    "過應變失效"
   ],
   "id": "defect-77d7e872",
   "source": "AI4I 2020 Predictive Maintenance (UCI)",
   "when": "UCI dataset 601",
   "layer": "vault",
   "content": "過應變失效 (Overstrain Failure)：刀具磨損×扭矩超過型別門檻(L11000/M12000/H13000 minNm)（觀測 wear_torque：11003–16497）",
   "who": "AI4I-2020"
  },
  "recipe-e49d5ef0": {
   "machine_type": "AI4I",
   "product": "AI4I-機台",
   "node_type": "Recipe",
   "keywords": [
    "AI4I",
    "OSF",
    "對策"
   ],
   "id": "recipe-e49d5ef0",
   "source": "AI4I 2020 Predictive Maintenance (UCI)",
   "when": "UCI dataset 601",
   "layer": "vault",
   "content": "OSF 對策：降低扭矩或提早換刀，使 磨損×扭矩 低於門檻",
   "who": "AI4I-2020"
  },
  "outcome-fc97275b": {
   "machine_type": "AI4I",
   "product": "AI4I-機台",
   "keywords": [
    "AI4I",
    "OSF"
   ],
   "source": "AI4I 2020 Predictive Maintenance (UCI)",
   "when": "UCI dataset 601",
   "layer": "vault",
   "content": "OSF 於資料集出現 98 次（0.98%）",
   "node_type": "Outcome",
   "metric": "OSF_count",
   "id": "outcome-fc97275b",
   "value": "98",
   "status": "failure",
   "who": "AI4I-2020"
  },
  "defect-fad17803": {
   "machine_type": "AI4I",
   "product": "AI4I-機台",
   "node_type": "Defect",
   "keywords": [
    "AI4I",
    "失效",
    "RNF",
    "隨機失效"
   ],
   "id": "defect-fad17803",
   "source": "AI4I 2020 Predictive Maintenance (UCI)",
   "when": "UCI dataset 601",
   "layer": "vault",
   "content": "隨機失效 (Random Failure)：約 0.1% 隨機發生，與參數無明顯關聯",
   "who": "AI4I-2020"
  },
  "recipe-71f8370b": {
   "machine_type": "AI4I",
   "product": "AI4I-機台",
   "node_type": "Recipe",
   "keywords": [
    "AI4I",
    "RNF",
    "對策"
   ],
   "id": "recipe-71f8370b",
   "source": "AI4I 2020 Predictive Maintenance (UCI)",
   "when": "UCI dataset 601",
   "layer": "vault",
   "content": "RNF 對策：難以參數預防；加強即時監測與冗餘",
   "who": "AI4I-2020"
  },
  "outcome-9d3d6d61": {
   "machine_type": "AI4I",
   "product": "AI4I-機台",
   "keywords": [
    "AI4I",
    "RNF"
   ],
   "source": "AI4I 2020 Predictive Maintenance (UCI)",
   "when": "UCI dataset 601",
   "layer": "vault",
   "content": "RNF 於資料集出現 19 次（0.19%）",
   "node_type": "Outcome",
   "metric": "RNF_count",
   "id": "outcome-9d3d6d61",
   "value": "19",
   "status": "failure",
   "who": "AI4I-2020"
  },
  "defect-62440b64": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Defect",
   "keywords": [
    "FMEA",
    "離心泵",
    "汽蝕"
   ],
   "source": "FMEA reliability knowledge",
   "id": "defect-62440b64",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "離心泵：汽蝕 (Cavitation)（成因：入口壓力不足/NPSH 餘裕低）",
   "who": "FMEA"
  },
  "outcome-354780db": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "keywords": [
    "FMEA",
    "影響"
   ],
   "source": "FMEA reliability knowledge",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "影響：葉輪侵蝕、流量下降、振動↑（S=7 O=5 D=4, RPN=140）",
   "node_type": "Outcome",
   "metric": "RPN",
   "id": "outcome-354780db",
   "value": "140",
   "status": "failure",
   "who": "FMEA"
  },
  "recipe-17d4e715": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Recipe",
   "keywords": [
    "FMEA",
    "離心泵",
    "對策"
   ],
   "source": "FMEA reliability knowledge",
   "id": "recipe-17d4e715",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "離心泵 對策：提高入口壓力或降轉速，確保 NPSHa>NPSHr",
   "who": "FMEA"
  },
  "defect-5e3aebf8": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Defect",
   "keywords": [
    "FMEA",
    "離心泵",
    "機械密封洩漏"
   ],
   "source": "FMEA reliability knowledge",
   "id": "defect-5e3aebf8",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "離心泵：機械密封洩漏（成因：密封面磨損或乾轉）",
   "who": "FMEA"
  },
  "outcome-41b9d98b": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "keywords": [
    "FMEA",
    "影響"
   ],
   "source": "FMEA reliability knowledge",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "影響：洩漏、停機、環境污染（S=8 O=4 D=5, RPN=160）",
   "node_type": "Outcome",
   "metric": "RPN",
   "id": "outcome-41b9d98b",
   "value": "160",
   "status": "failure",
   "who": "FMEA"
  },
  "recipe-f60d2988": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Recipe",
   "keywords": [
    "FMEA",
    "離心泵",
    "對策"
   ],
   "source": "FMEA reliability knowledge",
   "id": "recipe-f60d2988",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "離心泵 對策：更換密封、確保沖洗液、避免乾轉",
   "who": "FMEA"
  },
  "defect-9d88c5c5": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Defect",
   "keywords": [
    "FMEA",
    "滾動軸承",
    "早期疲勞剝落"
   ],
   "source": "FMEA reliability knowledge",
   "id": "defect-9d88c5c5",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "滾動軸承：早期疲勞剝落（成因：潤滑不足或污染）",
   "who": "FMEA"
  },
  "outcome-90291531": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "keywords": [
    "FMEA",
    "影響"
   ],
   "source": "FMEA reliability knowledge",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "影響：振動↑、噪音、過熱、卡死（S=8 O=5 D=3, RPN=120）",
   "node_type": "Outcome",
   "metric": "RPN",
   "id": "outcome-90291531",
   "value": "120",
   "status": "failure",
   "who": "FMEA"
  },
  "recipe-35ab135e": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Recipe",
   "keywords": [
    "FMEA",
    "滾動軸承",
    "對策"
   ],
   "source": "FMEA reliability knowledge",
   "id": "recipe-35ab135e",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "滾動軸承 對策：依規補充/更換潤滑、密封防塵、振動監測",
   "who": "FMEA"
  },
  "defect-a17f3465": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Defect",
   "keywords": [
    "FMEA",
    "感應馬達",
    "繞組過熱絕緣劣化"
   ],
   "source": "FMEA reliability knowledge",
   "id": "defect-a17f3465",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "感應馬達：繞組過熱絕緣劣化（成因：過載或散熱不良）",
   "who": "FMEA"
  },
  "outcome-96eeff33": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "keywords": [
    "FMEA",
    "影響"
   ],
   "source": "FMEA reliability knowledge",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "影響：絕緣崩潰、燒毀（S=9 O=4 D=4, RPN=144）",
   "node_type": "Outcome",
   "metric": "RPN",
   "id": "outcome-96eeff33",
   "value": "144",
   "status": "failure",
   "who": "FMEA"
  },
  "recipe-1df1dde5": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Recipe",
   "keywords": [
    "FMEA",
    "感應馬達",
    "對策"
   ],
   "source": "FMEA reliability knowledge",
   "id": "recipe-1df1dde5",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "感應馬達 對策：降載、改善散熱、加裝熱保護",
   "who": "FMEA"
  },
  "defect-d5762dc5": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Defect",
   "keywords": [
    "FMEA",
    "齒輪箱",
    "齒面點蝕/磨損"
   ],
   "source": "FMEA reliability knowledge",
   "id": "defect-d5762dc5",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "齒輪箱：齒面點蝕/磨損（成因：潤滑油劣化或過載）",
   "who": "FMEA"
  },
  "outcome-847315a1": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "keywords": [
    "FMEA",
    "影響"
   ],
   "source": "FMEA reliability knowledge",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "影響：傳動效率↓、異音、斷齒（S=7 O=4 D=5, RPN=140）",
   "node_type": "Outcome",
   "metric": "RPN",
   "id": "outcome-847315a1",
   "value": "140",
   "status": "failure",
   "who": "FMEA"
  },
  "recipe-16614881": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Recipe",
   "keywords": [
    "FMEA",
    "齒輪箱",
    "對策"
   ],
   "source": "FMEA reliability knowledge",
   "id": "recipe-16614881",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "齒輪箱 對策：換油、控制負載、油液監測",
   "who": "FMEA"
  },
  "defect-c5c4686f": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Defect",
   "keywords": [
    "FMEA",
    "離心風機",
    "喘振"
   ],
   "source": "FMEA reliability knowledge",
   "id": "defect-c5c4686f",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "離心風機：喘振 (Surge)（成因：系統阻力過高、工作點進入失速區）",
   "who": "FMEA"
  },
  "outcome-e7c56515": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "keywords": [
    "FMEA",
    "影響"
   ],
   "source": "FMEA reliability knowledge",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "影響：壓力週期波動、葉片疲勞（S=7 O=4 D=4, RPN=112）",
   "node_type": "Outcome",
   "metric": "RPN",
   "id": "outcome-e7c56515",
   "value": "112",
   "status": "failure",
   "who": "FMEA"
  },
  "recipe-411bd31f": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Recipe",
   "keywords": [
    "FMEA",
    "離心風機",
    "對策"
   ],
   "source": "FMEA reliability knowledge",
   "id": "recipe-411bd31f",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "離心風機 對策：開風門/降轉速使工作點離開失速區",
   "who": "FMEA"
  },
  "defect-e231f610": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Defect",
   "keywords": [
    "FMEA",
    "控制閥",
    "閥門"
   ],
   "source": "FMEA reliability knowledge",
   "id": "defect-e231f610",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "控制閥：閥門 hunting（成因：低負載/閥權限不足/PID 過激）",
   "who": "FMEA"
  },
  "outcome-41256d8a": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "keywords": [
    "FMEA",
    "影響"
   ],
   "source": "FMEA reliability knowledge",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "影響：流量震盪、製程不穩（S=5 O=6 D=5, RPN=150）",
   "node_type": "Outcome",
   "metric": "RPN",
   "id": "outcome-41256d8a",
   "value": "150",
   "status": "failure",
   "who": "FMEA"
  },
  "recipe-186e37b8": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Recipe",
   "keywords": [
    "FMEA",
    "控制閥",
    "對策"
   ],
   "source": "FMEA reliability knowledge",
   "id": "recipe-186e37b8",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "控制閥 對策：查閥權限與 Cv 選型、降 PID 增益",
   "who": "FMEA"
  },
  "defect-1c3cb0e8": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Defect",
   "keywords": [
    "FMEA",
    "熱交換器",
    "結垢"
   ],
   "source": "FMEA reliability knowledge",
   "id": "defect-1c3cb0e8",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "熱交換器：結垢 (Fouling)（成因：水質差/流速過低）",
   "who": "FMEA"
  },
  "outcome-18b72e0f": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "keywords": [
    "FMEA",
    "影響"
   ],
   "source": "FMEA reliability knowledge",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "影響：換熱效率↓、壓降↑（S=6 O=6 D=4, RPN=144）",
   "node_type": "Outcome",
   "metric": "RPN",
   "id": "outcome-18b72e0f",
   "value": "144",
   "status": "failure",
   "who": "FMEA"
  },
  "recipe-22a66a41": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Recipe",
   "keywords": [
    "FMEA",
    "熱交換器",
    "對策"
   ],
   "source": "FMEA reliability knowledge",
   "id": "recipe-22a66a41",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "熱交換器 對策：定期清洗、改善水處理、提高流速",
   "who": "FMEA"
  },
  "defect-a5e37cc7": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Defect",
   "keywords": [
    "FMEA",
    "冰水主機",
    "壓縮機液擊"
   ],
   "source": "FMEA reliability knowledge",
   "id": "defect-a5e37cc7",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "冰水主機：壓縮機液擊（成因：過熱度過低/冷媒過充）",
   "who": "FMEA"
  },
  "outcome-1b04835c": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "keywords": [
    "FMEA",
    "影響"
   ],
   "source": "FMEA reliability knowledge",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "影響：壓縮機損壞（S=9 O=3 D=5, RPN=135）",
   "node_type": "Outcome",
   "metric": "RPN",
   "id": "outcome-1b04835c",
   "value": "135",
   "status": "failure",
   "who": "FMEA"
  },
  "recipe-d3995b62": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Recipe",
   "keywords": [
    "FMEA",
    "冰水主機",
    "對策"
   ],
   "source": "FMEA reliability knowledge",
   "id": "recipe-d3995b62",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "冰水主機 對策：提高過熱度設定、調整冷媒充填量",
   "who": "FMEA"
  },
  "defect-28f8304a": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Defect",
   "keywords": [
    "FMEA",
    "變頻器",
    "過電流跳脫"
   ],
   "source": "FMEA reliability knowledge",
   "id": "defect-28f8304a",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "變頻器：過電流跳脫（成因：加減速過快/負載突變）",
   "who": "FMEA"
  },
  "outcome-be4a6623": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "keywords": [
    "FMEA",
    "影響"
   ],
   "source": "FMEA reliability knowledge",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "影響：停機、產線中斷（S=6 O=5 D=4, RPN=120）",
   "node_type": "Outcome",
   "metric": "RPN",
   "id": "outcome-be4a6623",
   "value": "120",
   "status": "failure",
   "who": "FMEA"
  },
  "recipe-9a40d7ec": {
   "machine_type": "FMEA",
   "product": "通用設備",
   "node_type": "Recipe",
   "keywords": [
    "FMEA",
    "變頻器",
    "對策"
   ],
   "source": "FMEA reliability knowledge",
   "id": "recipe-9a40d7ec",
   "when": "reliability-eng",
   "layer": "vault",
   "content": "變頻器 對策：延長加減速時間、加裝負載緩衝",
   "who": "FMEA"
  },
  "term-81ed2fb1": {
   "product": "紡織整經/織造",
   "aliases": [
    "Warping process"
   ],
   "keywords": [
    "整經",
    "Warping",
    "Warping process"
   ],
   "en": "Warping",
   "layer": "vault",
   "content": "整經（Warping）：將多根紗線由紗筒平行地捲繞在經單或經軸上的過程。",
   "node_type": "Term",
   "domain": "紡織整經/織造",
   "term": "整經",
   "definition": "將多根紗線由紗筒平行地捲繞在經單或經軸上的過程。",
   "id": "term-81ed2fb1",
   "category": "製程",
   "who": "glossary"
  },
  "term-f142cce4": {
   "product": "紡織整經/織造",
   "aliases": [
    "Warp yarn"
   ],
   "keywords": [
    "經紗",
    "Warp",
    "Warp yarn"
   ],
   "en": "Warp",
   "layer": "vault",
   "content": "經紗（Warp）：在織機上縱向排列，承受較高張力的紗線。",
   "node_type": "Term",
   "domain": "紡織整經/織造",
   "term": "經紗",
   "definition": "在織機上縱向排列，承受較高張力的紗線。",
   "id": "term-f142cce4",
   "category": "材料",
   "who": "glossary"
  },
  "term-1803b327": {
   "product": "紡織整經/織造",
   "aliases": [
    "Woof",
    "Filling yarn"
   ],
   "keywords": [
    "緯紗",
    "Weft",
    "Woof",
    "Filling yarn"
   ],
   "en": "Weft",
   "layer": "vault",
   "content": "緯紗（Weft）：在織造過程中橫向穿梭，與經紗交織的紗線。",
   "node_type": "Term",
   "domain": "紡織整經/織造",
   "term": "緯紗",
   "definition": "在織造過程中橫向穿梭，與經紗交織的紗線。",
   "id": "term-1803b327",
   "category": "材料",
   "who": "glossary"
  },
  "term-ab8adbb9": {
   "product": "紡織整經/織造",
   "aliases": [
    "Shed"
   ],
   "keywords": [
    "開口",
    "Shedding",
    "Shed"
   ],
   "en": "Shedding",
   "content": "開口（Shedding）：通過經片或朵花將經紗分為上下兩層，形成空間以讓緯紗通過。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "紡織整經/織造",
   "term": "開口",
   "definition": "通過經片或朵花將經紗分為上下兩層，形成空間以讓緯紗通過。",
   "id": "term-ab8adbb9",
   "category": "織造動作",
   "who": "glossary"
  },
  "term-a4e67f29": {
   "product": "紡織整經/織造",
   "aliases": [
    "Weft insertion"
   ],
   "keywords": [
    "打緯",
    "Picking",
    "Weft insertion"
   ],
   "en": "Picking",
   "content": "打緯（Picking）：將緯紗從織機的一側傳送到另一側的動作。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "紡織整經/織造",
   "term": "打緯",
   "definition": "將緯紗從織機的一側傳送到另一側的動作。",
   "id": "term-a4e67f29",
   "category": "織造動作",
   "who": "glossary"
  },
  "term-ee1a925b": {
   "product": "紡織整經/織造",
   "aliases": [
    "Battening"
   ],
   "keywords": [
    "打實",
    "Beating-up",
    "Battening"
   ],
   "en": "Beating-up",
   "content": "打實（Beating-up）：由筘將新插入的緯紗推向已織成的布面，使其緊密結合。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "紡織整經/織造",
   "term": "打實",
   "definition": "由筘將新插入的緯紗推向已織成的布面，使其緊密結合。",
   "id": "term-ee1a925b",
   "category": "織造動作",
   "who": "glossary"
  },
  "term-7b5e70d1": {
   "product": "面板 LCD",
   "aliases": [
    "TFT"
   ],
   "keywords": [
    "薄膜電晶體",
    "Thin Film Transistor",
    "TFT"
   ],
   "en": "Thin Film Transistor",
   "layer": "vault",
   "content": "薄膜電晶體（Thin Film Transistor）：用於控制像素開關的微小電晶體，構成面板的驅動電路。",
   "node_type": "Term",
   "domain": "面板 LCD",
   "term": "薄膜電晶體",
   "definition": "用於控制像素開關的微小電晶體，構成面板的驅動電路。",
   "id": "term-7b5e70d1",
   "category": "元件",
   "who": "glossary"
  },
  "term-c91e0504": {
   "product": "面板 LCD",
   "aliases": [
    "LC"
   ],
   "keywords": [
    "液晶",
    "Liquid Crystal",
    "LC"
   ],
   "en": "Liquid Crystal",
   "content": "液晶（Liquid Crystal）：介於液體與固體之間狀態的物質，透過電壓控制光線通過量。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "面板 LCD",
   "definition": "介於液體與固體之間狀態的物質，透過電壓控制光線通過量。",
   "term": "液晶",
   "id": "term-c91e0504",
   "category": "材料",
   "who": "glossary"
  },
  "term-70246ab2": {
   "product": "面板 LCD",
   "aliases": [
    "BLU"
   ],
   "keywords": [
    "背光模組",
    "Backlight Unit",
    "BLU"
   ],
   "en": "Backlight Unit",
   "content": "背光模組（Backlight Unit）：提供光源的組件，通常由 LED 燈條與導光板組成。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "面板 LCD",
   "term": "背光模組",
   "definition": "提供光源的組件，通常由 LED 燈條與導光板組成。",
   "id": "term-70246ab2",
   "category": "模組",
   "who": "glossary"
  },
  "term-e49c10dc": {
   "product": "面板 LCD",
   "aliases": [
    "Compensation Film"
   ],
   "keywords": [
    "光學相移層",
    "Retardation Film",
    "Compensation Film"
   ],
   "en": "Retardation Film",
   "content": "光學相移層（Retardation Film）：用來控制光波相位以提升對比度與視角的薄膜。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "面板 LCD",
   "term": "光學相移層",
   "definition": "用來控制光波相位以提升對比度與視角的薄膜。",
   "id": "term-e49c10dc",
   "category": "光學材料",
   "who": "glossary"
  },
  "term-eee1ca51": {
   "product": "面板 LCD",
   "aliases": [
    "Photo",
    "光學曝光"
   ],
   "keywords": [
    "光刻",
    "Photolithography",
    "Photo",
    "光學曝光"
   ],
   "en": "Photolithography",
   "content": "光刻（Photolithography）：利用光線將電路圖案轉移到基板上的微細加工製程。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "面板 LCD",
   "term": "光刻",
   "definition": "利用光線將電路圖案轉移到基板上的微細加工製程。",
   "id": "term-eee1ca51",
   "category": "製程",
   "who": "glossary"
  },
  "term-f48c8b28": {
   "product": "面板 LCD",
   "aliases": [
    "開口率"
   ],
   "keywords": [
    "像素填充率",
    "Aperture Ratio",
    "開口率"
   ],
   "en": "Aperture Ratio",
   "layer": "vault",
   "content": "像素填充率（Aperture Ratio）：單個像素中實際透光區域與總面積的比率。",
   "node_type": "Term",
   "domain": "面板 LCD",
   "term": "像素填充率",
   "definition": "單個像素中實際透光區域與總面積的比率。",
   "id": "term-f48c8b28",
   "category": "性能指標",
   "who": "glossary"
  },
  "term-a2c559d8": {
   "product": "半導體製程",
   "aliases": [
    "Lithography",
    "光學微影"
   ],
   "keywords": [
    "光刻",
    "Photolithography",
    "Lithography",
    "光學微影"
   ],
   "en": "Photolithography",
   "content": "光刻（Photolithography）：利用光線將電路圖案透過光罩轉移至塗有光阻劑的晶圓表面。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "半導體製程",
   "definition": "利用光線將電路圖案透過光罩轉移至塗有光阻劑的晶圓表面。",
   "term": "光刻",
   "id": "term-a2c559d8",
   "category": "前段製程",
   "who": "glossary"
  },
  "term-e980835b": {
   "product": "半導體製程",
   "aliases": [
    "CMP"
   ],
   "keywords": [
    "化學機械平坦化",
    "Chemical Mechanical Polishing",
    "CMP"
   ],
   "en": "Chemical Mechanical Polishing",
   "layer": "vault",
   "content": "化學機械平坦化（Chemical Mechanical Polishing）：結合化學腐蝕與機械磨削，使晶圓表面達到極高平整度的製程。",
   "node_type": "Term",
   "domain": "半導體製程",
   "term": "化學機械平坦化",
   "definition": "結合化學腐蝕與機械磨削，使晶圓表面達到極高平整度的製程。",
   "id": "term-e980835b",
   "category": "平坦化",
   "who": "glossary"
  },
  "term-2a88b1d3": {
   "product": "半導體製程",
   "aliases": [
    "Ion Implant"
   ],
   "keywords": [
    "離子植入",
    "Ion Implantation",
    "Ion Implant"
   ],
   "en": "Ion Implantation",
   "layer": "vault",
   "content": "離子植入（Ion Implantation）：將高能離子加速注入矽晶圓內部以改變電導率或形成接面。",
   "node_type": "Term",
   "domain": "半導體製程",
   "term": "離子植入",
   "definition": "將高能離子加速注入矽晶圓內部以改變電導率或形成接面。",
   "id": "term-2a88b1d3",
   "category": "摻雜",
   "who": "glossary"
  },
  "term-230e09b5": {
   "product": "半導體製程",
   "aliases": [
    "CVD"
   ],
   "keywords": [
    "化學氣相沉積",
    "Chemical Vapor Deposition",
    "CVD"
   ],
   "en": "Chemical Vapor Deposition",
   "layer": "vault",
   "content": "化學氣相沉積（Chemical Vapor Deposition）：利用氣態前驅物在晶圓表面發生化學反應，形成薄膜的過程。",
   "node_type": "Term",
   "domain": "半導體製程",
   "term": "化學氣相沉積",
   "definition": "利用氣態前驅物在晶圓表面發生化學反應，形成薄膜的過程。",
   "id": "term-230e09b5",
   "category": "薄膜沉積",
   "who": "glossary"
  },
  "term-a0109144": {
   "product": "半導體製程",
   "aliases": [
    "Plasma Etching",
    "RIE"
   ],
   "keywords": [
    "乾式蝕刻",
    "Dry Etching",
    "Plasma Etching",
    "RIE"
   ],
   "en": "Dry Etching",
   "content": "乾式蝕刻（Dry Etching）：利用電漿（Plasma）中的活性離子與基團移除不需要的材料。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "半導體製程",
   "term": "乾式蝕刻",
   "definition": "利用電漿（Plasma）中的活性離子與基團移除不需要的材料。",
   "id": "term-a0109144",
   "category": "蝕刻",
   "who": "glossary"
  },
  "term-1a02b896": {
   "product": "半導體製程",
   "aliases": [
    "ALD"
   ],
   "keywords": [
    "原子層沉積",
    "Atomic Layer Deposition",
    "ALD"
   ],
   "en": "Atomic Layer Deposition",
   "layer": "vault",
   "content": "原子層沉積（Atomic Layer Deposition）：一種特殊的CVD，透過交替供給前驅物，實現原子級厚度控制的薄膜生長。",
   "node_type": "Term",
   "domain": "半導體製程",
   "term": "原子層沉積",
   "definition": "一種特殊的CVD，透過交替供給前驅物，實現原子級厚度控制的薄膜生長。",
   "id": "term-1a02b896",
   "category": "薄膜沉積",
   "who": "glossary"
  },
  "term-5dd242c2": {
   "product": "風機/送風",
   "aliases": [
    "Axial Fan"
   ],
   "keywords": [
    "軸流風機",
    "Axial Flow Fan",
    "Axial Fan"
   ],
   "en": "Axial Flow Fan",
   "content": "軸流風機（Axial Flow Fan）：空氣沿著軸線方向流動的風機，適用於大風量、低壓力的通風需求。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "風機/送風",
   "term": "軸流風機",
   "definition": "空氣沿著軸線方向流動的風機，適用於大風量、低壓力的通風需求。",
   "id": "term-5dd242c2",
   "category": "設備類型",
   "who": "glossary"
  },
  "term-2481c1a2": {
   "product": "風機/送風",
   "aliases": [
    "Centrifugal Blower"
   ],
   "keywords": [
    "離心風機",
    "Centrifugal Fan",
    "Centrifugal Blower"
   ],
   "en": "Centrifugal Fan",
   "layer": "vault",
   "content": "離心風機（Centrifugal Fan）：空氣進入風機後被甩向徑向排出，能產生較高靜壓的風機。",
   "node_type": "Term",
   "domain": "風機/送風",
   "term": "離心風機",
   "definition": "空氣進入風機後被甩向徑向排出，能產生較高靜壓的風機。",
   "id": "term-2481c1a2",
   "category": "設備類型",
   "who": "glossary"
  },
  "term-e7640ccc": {
   "product": "風機/送風",
   "aliases": [
    "SP"
   ],
   "keywords": [
    "靜壓",
    "Static Pressure",
    "SP"
   ],
   "en": "Static Pressure",
   "content": "靜壓（Static Pressure）：風機克服管路阻力（如濾網、彎管）而產生的壓力。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "風機/送風",
   "definition": "風機克服管路阻力（如濾網、彎管）而產生的壓力。",
   "term": "靜壓",
   "id": "term-e7640ccc",
   "category": "性能參數",
   "who": "glossary"
  },
  "term-c25e11d3": {
   "product": "風機/送風",
   "aliases": [
    "Air Volume",
    "CMH",
    "CFM"
   ],
   "keywords": [
    "風量",
    "Airflow Rate",
    "Air Volume",
    "CMH",
    "CFM"
   ],
   "en": "Airflow Rate",
   "content": "風量（Airflow Rate）：單位時間內風機能輸送的空氣體積。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "風機/送風",
   "term": "風量",
   "definition": "單位時間內風機能輸送的空氣體積。",
   "id": "term-c25e11d3",
   "category": "性能參數",
   "who": "glossary"
  },
  "term-542dd3bc": {
   "product": "風機/送風",
   "aliases": [
    "VFD",
    "Inverter"
   ],
   "keywords": [
    "變頻器",
    "Variable Frequency Drive",
    "VFD",
    "Inverter"
   ],
   "en": "Variable Frequency Drive",
   "content": "變頻器（Variable Frequency Drive）：透過改變電壓與頻率來調節風機馬達轉速的電子設備。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "風機/送風",
   "definition": "透過改變電壓與頻率來調節風機馬達轉速的電子設備。",
   "term": "變頻器",
   "id": "term-542dd3bc",
   "category": "控制元件",
   "who": "glossary"
  },
  "term-d069a78f": {
   "product": "風機/送風",
   "aliases": [
    "Blower Wheel",
    "Fan Blade"
   ],
   "keywords": [
    "葉輪",
    "Impeller",
    "Blower Wheel",
    "Fan Blade"
   ],
   "en": "Impeller",
   "content": "葉輪（Impeller）：風機內部負責將機械能轉化為氣流動能的旋轉葉片組件。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "風機/送風",
   "term": "葉輪",
   "definition": "風機內部負責將機械能轉化為氣流動能的旋轉葉片組件。",
   "id": "term-d069a78f",
   "category": "核心零件",
   "who": "glossary"
  },
  "term-965619de": {
   "product": "水機/冰水主機",
   "aliases": [
    "Cooling Tower",
    "CT"
   ],
   "keywords": [
    "冷卻塔",
    "Cooling Tower",
    "Cooling Tower",
    "CT"
   ],
   "en": "Cooling Tower",
   "content": "冷卻塔（Cooling Tower）：透過水與空氣的熱交換將冷卻水溫降低的設備。",
   "layer": "vault",
   "node_type": "Term",
   "domain": "水機/冰水主機",
   "term": "冷卻塔",
   "definition": "透過水與空氣的熱交換將冷卻水溫降低的設備。",
   "id": "term-965619de",
   "category": "熱交換設備",
   "who": "glossary"
  },
  "recipe-66eefcc8": {
   "product": "NX-220",
   "node_type": "Recipe",
   "keywords": [
    "張力",
    "車速",
    "彈性紗",
    "NX-220",
    "整經"
   ],
   "session_id": "graph-dyn",
   "id": "recipe-66eefcc8",
   "params": "{\"pid_p_gain\": \"decrease\", \"integral_time\": \"increase\", \"pump_frequency\": \"increase\"}",
   "content": "NX-220 整經：{'pid_p_gain': 'decrease', 'integral_time': 'increase', 'pump_frequency': 'increase'}",
   "layer": "vault"
  },
  "outcome-8211fb49": {
   "product": "NX-220",
   "node_type": "Outcome",
   "keywords": [
    "斷紗率"
   ],
   "metric": "斷紗率",
   "session_id": "graph-dyn",
   "id": "outcome-8211fb49",
   "value": "5.1%→0.9%",
   "content": "NX-220 斷紗率 5.1%→0.9%",
   "layer": "vault",
   "status": "success"
  },
  "recipe-639bc3e5": {
   "product": "NX-220",
   "node_type": "Recipe",
   "keywords": [
    "張力",
    "車速",
    "彈性紗",
    "NX-220",
    "整經"
   ],
   "session_id": "graph-dyn",
   "id": "recipe-639bc3e5",
   "params": "{\"cell_gap_calibration\": \"precise_adjustment\", \"substrate_parallelism\": \"high_precision\", \"tension_cN\": null, \"speed_pct\": null}",
   "content": "NX-220 整經：{'cell_gap_calibration': 'precise_adjustment', 'substrate_parallelism': 'high_precision', 'tension_cN': None, 'speed_pct': None}",
   "layer": "vault"
  },
  "outcome-25769f7a": {
   "product": "NX-220",
   "node_type": "Outcome",
   "keywords": [
    "斷紗率"
   ],
   "metric": "斷紗率",
   "session_id": "graph-dyn",
   "id": "outcome-25769f7a",
   "value": "5.1%→0.9%",
   "content": "NX-220 斷紗率 5.1%→0.9%",
   "layer": "vault",
   "status": "success"
  },
  "recipe-678cb671": {
   "id": "recipe-678cb671",
   "node_type": "Recipe",
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  {
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  }
 ]
}